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Quantum wave function imaging

A technology of quantum wave and function, which is applied in the field of stereo imaging of objects, can solve the problems of limited application, failure to measure the precise distribution of quantum wave function, etc., and achieve the effects of wide application, easy adjustment and realization, and reduced damage

Inactive Publication Date: 2018-06-15
胡孟军 +2
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Problems solved by technology

However, there are two main problems in using the weak measurement method to measure the quantum wave function: first, in order to realize the weak measurement of the photon position, the coupling between the system and the pointer is required to be very small, otherwise the weak measurement method is no longer applicable, which limits Second, the real part and the imaginary part of the photon wave function are respectively given by the real part and the imaginary part of the weak value in the weak measurement, and the weak value is the value obtained under the first-order approximation of the weak coupling, Only when the approximate conditions hold true can the measured quantum wave function reflect the actual quantum wave function better, so the precise distribution of the quantum wave function cannot be measured in principle

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Embodiment Construction

[0038] The technical solutions in the embodiments of the present invention are clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0039] The embodiment of the present invention provides a method for directly measuring the quantum wave function of the diffracted photon to realize the stereo imaging of the object. The core of the solution is to realize the direct and accurate measurement of the quantum wave function of the photon. The direct and accurate measurement method of the photon quantum wave function is as follows: the incident photon is polarized preprocessed so that the ph...

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Abstract

The invention discloses a method for realizing stereoscopic imaging of an object by directly and precisely measuring the quantum wave function of diffracted particles. According to the core idea of the invention, the stereoscopic imaging of a measured object is realized by means of comparing the quantum wave function distribution of diffracted particles which is measured directly and precisely with the known quantum wave function distribution of incident particles. According to a traditional method, diffraction intensity distribution is measured so as to estimate or calculate phase distribution to realize imaging, while, the method of the invention can directly measure the phase distribution of a diffraction quantum wave function so as to obtain more abundant structure information of the measured object; and therefore, compared with the traditional method, the method of the invention has the advantages of low cost and easiness in adjustment and realization, and can be widely used in imaging, structural analysis, surveying and mapping and other fields. Since a single-particle source is adopted, when the measured object is a biological tissue, the method of the invention can greatlyreduce damage to the biological tissue.

Description

technical field [0001] The invention relates to the field of imaging, in particular to a method for realizing object stereoscopic imaging by directly and accurately measuring the quantum wave function of diffracted particles. Background technique [0002] The traditional imaging method obtains the information of the measured object by measuring the diffraction distribution of incident particles, such as photons, electrons, protons, neutrons, etc. after passing through the measured object. Since the rich internal structure information of the measured object is generally reflected in the phase of the particle's diffracted object field distribution (ie, the outgoing quantum wave function), traditional measurement techniques can only extract the phase distribution of the diffracted field by means of estimation or calculation. The phase information of the diffraction field distribution cannot be obtained effectively and accurately, so more accurate detailed information of the mea...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00G01J4/00
CPCG01J4/00G01J11/00G01J4/04
Inventor 胡孟军张永生胡晓敏
Owner 胡孟军
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