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A method for preparing a micron ionic crystal powder sample for scanning electron microscopy

A technology of ion crystal and scanning electron microscope, which is applied in the direction of material analysis, measuring devices, and instruments using wave/particle radiation, can solve problems such as agglomeration and agglomeration, and achieve short sample preparation cycle, tight combination, and uniform powder dispersion Effect

Active Publication Date: 2018-06-15
GUANGDONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to overcome the shortcomings and deficiencies in the prior art, the object of the present invention is to provide a method for preparing a scanning electron microscope sample of a micron-sized ionic crystal powder. The prepared powder scanning electron microscope sample has uniform powder dispersion and can avoid particle agglomeration and The problem of agglomeration, the powder sample is closely combined with the resin glue, and the adhesion is high, so as to avoid the problem of polluting the working chamber of the electron microscope

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  • A method for preparing a micron ionic crystal powder sample for scanning electron microscopy

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Embodiment 1

[0033] A method for preparing a scanning electron microscope sample of a micron-sized ionic crystal powder, comprising the steps of:

[0034] (1) Dispersion: Take the powder sample and the dispersion liquid according to a certain proportion, add the powder sample into the dispersion liquid and stir to disperse to obtain a suspension;

[0035] (2) Sampling: Take 1-2 drops of the suspension in step (1) in the mold and volatilize at a certain temperature. After the dispersion is volatilized, the dispersed powder sample is obtained;

[0036] (3) Prepare the resin glue: blend the resin and the curing agent in a certain proportion, and stir to obtain the resin glue for curing the sample;

[0037] (4) Cold mounting sample preparation: Pour the resin glue prepared in step (3) into the mold of step (2), and let it stand at a certain temperature until the sample is solidified to obtain a metallographic sample;

[0038] (5) Gold spraying: Sputtering gold spraying on the surface of the s...

Embodiment 2

[0048] A method for preparing a scanning electron microscope sample of a micron-sized ionic crystal powder, comprising the steps of:

[0049] (1) Dispersion: Take the powder sample and the dispersion liquid according to a certain proportion, add the powder sample into the dispersion liquid and stir to disperse to obtain a suspension;

[0050] (2) Sampling: Take 1-2 drops of the suspension in step (1) in the mold and volatilize at a certain temperature. After the dispersion is volatilized, the dispersed powder sample is obtained;

[0051] (3) Prepare the resin glue: blend the resin and the curing agent in a certain proportion, and stir to obtain the resin glue for curing the sample;

[0052] (4) Cold mounting sample preparation: Pour the resin glue prepared in step (3) into the mold of step (2), and let it stand at a certain temperature until the sample is solidified to obtain a metallographic sample;

[0053] (5) Gold spraying: Sputtering gold spraying on the surface of the s...

Embodiment 3

[0062] A method for preparing a scanning electron microscope sample of a micron-sized ionic crystal powder, comprising the steps of:

[0063] (1) Dispersion: Take the powder sample and the dispersion liquid according to a certain proportion, add the powder sample into the dispersion liquid and stir to disperse to obtain a suspension;

[0064] (2) Sampling: Take 1-2 drops of the suspension in step (1) in the mold and volatilize at a certain temperature. After the dispersion is volatilized, the dispersed powder sample is obtained;

[0065] (3) Prepare the resin glue: blend the resin and the curing agent in a certain proportion, and stir to obtain the resin glue for curing the sample;

[0066] (4) Cold mounting sample preparation: Pour the resin glue prepared in step (3) into the mold of step (2), and let it stand at a certain temperature until the sample is solidified to obtain a metallographic sample;

[0067] (5) Gold spraying: Sputtering gold spraying on the surface of the s...

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Abstract

The invention relates to the technical field of preparation of samples for scanning electron microscopy, and particularly relates to a method for preparing a micron ionic crystal powder sample for scanning electron microscopy. The method includes steps of (1) dispersing, (2) sampling, (3) preparing resin glue, (4) performing cold mounting to prepare a sample and (5) spraying gold. The prepared powder scanning electron microscopy sample is uniform in powder dispersion so that particle caking and agglomeration can be avoided. The powder sample is tightly bound with the resin glue and adhesive force is high so that the powder can be firmly embedded. Compared with traditional methods, the method can effectively overcome a problem that samples fly away from sample tables during vacuumization and testing and pollute microscopy cavities due to low binding force between powder and conductive glue. After gold plating, electrical conductivity of the powder sample is improved, images are made clear and clear electron microscopy observation having high resolution can be achieved. The method has characteristics of a short sample preparing period, simple operation and good practicability.

Description

technical field [0001] The invention relates to the technical field of scanning electron microscope sample preparation, in particular to a method for preparing a scanning electron microscope sample of micron-sized ionic crystal powder. Background technique [0002] In recent years, the development of new energy materials has been very rapid, such as positive electrode materials for lithium-ion batteries, various magnetic functional materials, etc. There is an increasing demand for rapid and accurate observation and research on the surface morphology of such micron-scale ionic crystal particle powders. more urgent. At present, the most commonly used method for such powder samples is the conductive adhesive adhesion method. The shortcomings of this method are mainly reflected in two points: one is that compared with bulk samples, fine powder samples usually have higher surface energy, The particles are easy to gather into clusters and stack each other, so the degree of disper...

Claims

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Application Information

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IPC IPC(8): G01N23/2202
CPCG01N23/2202
Inventor 刘方方
Owner GUANGDONG UNIV OF SCI & TECH
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