Half-cut photovoltaic module hot spot temperature test method

Abstract

The invention provides a method for testing the hot spot temperature of a half-cut photovoltaic module, comprising the following steps: S1, selecting a piece, determining the battery piece with the largest leakage in the half-cut photovoltaic module; S2, selecting an area, determining the worst covering area of ​​the half-cut photovoltaic module; S3. Select hotspots, select hotspots on each selected cell with the largest leakage, and use the worst covering area to cover the non-hotspot areas; S4, Exposure to the sun, short-circuit the positive and negative terminals of half a photovoltaic module, and put it into a steady state simulation Expose in the box to determine the hot spot temperature of half a photovoltaic module. The hot spot temperature testing method of the half-cut photovoltaic module can not only determine the worst covering area of ​​the half-cut photovoltaic module, but also quickly and easily analyze the hot spot temperature of the half-cut photovoltaic module, which provides a basis for the analysis of the hot spot of the half-cut photovoltaic module. Facilitate the assessment of hot spot risk to improve the reliability of half-cut photovoltaic modules.

Description

technical field [0001] The invention relates to a method for testing a hot spot of a half-chip photovoltaic module, belonging to the technical field of photovoltaic power generation. Background technique [0002] Due to the rapid growth of photovoltaic module market demand, power station investors have higher and higher requirements for the efficiency and power of photovoltaic modules. Conventional photovoltaic modules are gradually withdrawing from the competitive market, and half-cell photovoltaic modules, as a high-power photovoltaic Modules have begun to be widely used and researched; the existing half-cell photovoltaic modules are usually cut into two halves by laser scribing, and the half-cut cells are connected in series, and then connected in parallel It is made into a half-cut photovoltaic module, so the half-cut photovoltaic module can effectively reduce the current mismatch of the cells in the module, and the current loss within the module itself is reduced, so th...

AI Technical Summary

Problems solved by technology

[0003] However, due to the change of the original circuit connection method of the half-cell photovoltaic module, the original hot spot test method is no longer applicable

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