Terahertz reflection imaging system based on zero order Bessel wave beams

A Bessel beam and imaging system technology, applied in the field of terahertz imaging, can solve the problem of not being able to provide high imaging resolution and large depth of field at the same time, and achieve the effect of expanding the range of imaging thickness, reducing restrictions, and extending depth of field

Pending Publication Date: 2018-07-10
HUAZHONG UNIV OF SCI & TECH
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  • Claims
  • Application Information

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Problems solved by technology

[0004] Overall, existing terahertz reflection imaging systems cannot simultaneously provide high imaging resolution and large depth of field

Method used

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  • Terahertz reflection imaging system based on zero order Bessel wave beams
  • Terahertz reflection imaging system based on zero order Bessel wave beams
  • Terahertz reflection imaging system based on zero order Bessel wave beams

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Embodiment Construction

[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0025] Such as figure 1 The shown terahertz reflection imaging system based on zero-order Bessel beams includes: terahertz emission source 1, chopper 2, collimator lens 3, silicon wafer 4, diffraction element 5, focusing lens 6, terahertz detector Device 7, sample stage 8, sample stage moving device 9, lock-in amplifier 10 and control module 11;

[0026]The terahertz emission source 1 is used ...

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Abstract

The invention discloses a Terahertz reflection imaging system based on zero order Bessel wave beams. The system comprises a Terahertz emission source, a collimating lens, a silicon chip, a diffractionelement, a focusing lens, a Terahertz detector, a sample table, a sample table moving device, a lock phase amplifier and a control module, wherein the collimating lens, the silicon chip, the diffraction element and the sample table are in sequential arrangement in a direction along the transmission direction; the center of the silicon chip is positioned in the center axial line of the transmission wave beams; an included angle between the silicon chip and the center axial line is 45 degrees; the main optical axes of the collimating lens and the diffraction element are positioned in the centeraxial line of the transmission wave beams; through the diffraction element, the transmission wave beams become the zero order Bessel wave beams; the main optical axis of the focusing lens is positioned on a reflection light path and is vertical to the center axial line of the transmission wave beam; the Terahertz detector is positioned on the focal plane of the focusing lens and is connected withthe lock phase amplifier; the control module is respectively connected with the sample table moving device and the lock phase amplifier. The Terahertz reflection imaging system can simultaneously provide high imaging quality and large depth of field.

Description

technical field [0001] The invention belongs to the technical field of terahertz imaging, and more specifically relates to a terahertz reflection imaging system based on zero-order Bessel beams. Background technique [0002] Terahertz Wave (THz wave for short) refers to a section of electromagnetic wave with a frequency between 100 GHz and 10 THz (wavelength 30 μm to 3 mm), which is located between infrared waves and microwave bands. Terahertz waves have some unique properties compared to electromagnetic waves in other bands. Because the terahertz wave is located between the infrared wave and the microwave, it has the characteristics of two wave bands: it has the penetration ability similar to the microwave and the directionality similar to the light wave on the macroscopic level, and has quantum characteristics on the microscopic level. It is equivalent to the rotational energy level of the molecule. Terahertz waves have good penetration to many dielectric materials and n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3581
CPCG01N21/3581
Inventor 刘劲松牛丽婷杨振刚王可嘉
Owner HUAZHONG UNIV OF SCI & TECH
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