Automatic test switching circuit of low-frequency interface

A technology for automatic testing and switching circuits, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., to achieve the effect of increasing the number and improving safety

Active Publication Date: 2018-07-10
CHINA ACADEMY OF SPACE TECHNOLOGY
View PDF5 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is: to overcome the shortcomings of the existing methods, provide a low-frequency interface automatic test switch circuit, and solve the current situation of a large number of switches and potential safety hazards in the switch circuit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic test switching circuit of low-frequency interface
  • Automatic test switching circuit of low-frequency interface
  • Automatic test switching circuit of low-frequency interface

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Describe in detail below in conjunction with accompanying drawing:

[0021] Such as figure 2 Shown is the schematic block diagram of the satellite low frequency interface automatic test switch circuit. Its main function is to realize the on-off control of on-board contacts and the routing between the signal to be tested and the test instrument. On the one hand, it is connected to multiple low-frequency interfaces on the star, and on the other hand, it is connected to test instruments, such as oscilloscopes and multimeters. Contains multiple contact switching circuits and an inter-board switching circuit. In the specific implementation, a contact switching circuit is in the form of a board, and each contact switching board corresponds to a low-frequency interface on the star. Realize contact on and off, and select several outputs from the contacts on the star. The inter-board switching circuit selects several output signals from multiple contact switching boards to ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention provides an automatic test switching circuit of a low-frequency interface. The circuit comprises a plurality of contact switching circuits and an inter-board switching circuit. The contact switching circuits achieve a traditional junction box function and are formed by two portions consisting of on-off control circuits and measurement switching circuits. The on-off control circuits are connected with a low-frequency interface to be measured of a satellite to control on-off of an interface cable terminal and a device terminal and introduce signals to be measured into the measurement switching circuits. The measurement switching circuits select several paths of signals to be measured for output from the multiple paths of signals to be measured. The inter-board switchingcircuit selects paths of signals to perform routing to a measurement instrument from output signals of the contact switching circuits. The automatic test switching circuit of the low-frequency interface can replace traditional junction boxes, and is high in design integration level. Compared to a traditional circuit, the number of measurement switching switches is reduced, the short circuit cannot be generated between contacts when switching of the switches. the safety of the device is greatly improved, and the automatic test switching circuit of the low-frequency interface can be modularizedand facilitates system expansion.

Description

technical field [0001] The invention relates to a low-frequency interface automatic test switch circuit, which belongs to the field of testing. Background technique [0002] Satellite low-frequency interface test is one of the key links in the whole satellite comprehensive test process. It plays a very important role in ensuring the compatibility of the satellite interface and verifying the correctness of the cable network design. The low-frequency interface automatic test system integrates oscilloscope, multimeter measurement functions, traditional transfer box contact on-off and measurement signal switching functions, which can greatly improve the efficiency of testing. [0003] The switch circuit is responsible for the transmission and distribution of signals in the automatic test system. By setting the switches in different configurations, the signal routing between the tested signal and the test resource is realized. In the low-frequency interface test, the switch ci...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 梁泉焦荣惠范振昊王爽
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap