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Microsphere rotating and clamping device

A technology of rotating clamping device and rotating clamping device, which is applied to workpiece clamping devices, measuring devices, instruments, etc., can solve the problems such as the inability to meet the full surface measurement of microspheres and the small measurement range of atomic force microscopes, and achieve light weight and simplified structure. , to achieve the effect of power off self-locking

Active Publication Date: 2018-08-03
SHANGHAI INST OF MEASUREMENT & TESTING TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a microsphere rotating clamping device, which mainly solves the technical problem that the existing atomic force microscope has a small measurement range and cannot meet the full surface measurement of microspheres

Method used

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  • Microsphere rotating and clamping device

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Embodiment Construction

[0018] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0019] refer to Figure 1 to Figure 3 , a microsphere rotating clamping device of the present invention is mainly composed of an X-axis rotating clamping end 1, a Y-axis rotating clamping end 3, an X-direction micro-movement platform 4 and a Y-direction micro-movement platform 2. The X-axis rotation The clamping end 1 and the Y-axis rotating clamping end 3 are respectively fixed on the Y-direction micro-movement platform 2 and the X-direction micro-movement platform 4 by screws 5 .

[0020] The X-axis rotating clamping end 1 and the Y-axis rotating clamping end 3 have the same structure and are distributed vertically. The base 113 and the housing 112 fixed on the base by screws a11 are provided with a main shaft 19 at the center of the base. 19 passes through the shell 112 and is hollow inside. The left end of the main shaft 19 is provided with an internal thread an...

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Abstract

The invention discloses a microsphere rotating and clamping device. The technical problems that the conventional atomic force microscope is narrow in measurement range and full-surface measurement ofmicrospheres cannot be met are mainly solved. According to the technical scheme of the invention, the microsphere rotating and clamping device is composed of an X-axis rotating and clamping end, a Y-axis rotating and clamping end, an X-direction micro-motion platform and a Y-direction micro motion platform, wherein the X-axis rotating and clamping end and the Y-axis rotating and clamping end are respectively fixed on the Y-direction micro motion platform and the X-direction micro-motion platform by virtue of screws. According to the device disclosed by the invention, microspheres can be clamped and can also be rotated by a certain angle to be measured according to a certain rule, so that the measurement range of the atomic force microscope on the microsphere surface is widened.

Description

technical field [0001] The invention relates to the field of microsphere detection, in particular to a microsphere rotating clamping device. Background technique [0002] Microspheres with diameters ranging from tens of microns to several millimeters are widely used in fields such as precision machinery, medical diagnosis, micro-electromechanical systems, and nuclear fusion science research. In the field of precision machinery, as the core parts of precision motion, micro balls and spherical shaft tips are widely used, and their surface quality plays an important role in the accuracy and life of the motion mechanism; in the medical field, the surface morphology of microballs and their Concentration is closely related to protein-microsphere binding degree and detection sensitivity; in micro-electromechanical systems, the probe of the micro-nano measuring machine is used as a sensor for the geometric feature information of the workpiece to be measured, and the diameter of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/20B25B11/00
CPCG01B21/20B25B11/005Y02E30/10
Inventor 蔡潇雨陈厚瑞魏佳斯周勇
Owner SHANGHAI INST OF MEASUREMENT & TESTING TECH