Calibration method for inherent errors of TDC time interval measurement

A time interval measurement and inherent error technology, applied in the field of signal processing, can solve problems such as poor reconfiguration and increase the complexity of the measurement system structure, and achieve the effect of improving measurement accuracy, reducing miscount rate and bit width error

Active Publication Date: 2018-09-28
米银(杭州)信息科技有限公司
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Problems solved by technology

[0003] At present, there are also calibration methods for the inherent error of time interval measurement, but most of them are realized by improving the circuit structure of the measurement system. However, this type of scheme will increase the complexity of the entire measurement system structure, and the reconfiguration is poor.

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  • Calibration method for inherent errors of TDC time interval measurement
  • Calibration method for inherent errors of TDC time interval measurement
  • Calibration method for inherent errors of TDC time interval measurement

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Embodiment Construction

[0029] The present invention will be further described below in conjunction with the accompanying drawings.

[0030] The invention provides a calibration method for the inherent error of TDC time interval measurement, which is used to reduce the inherent measurement error of the TDC measurement system caused by process defects.

[0031] refer to figure 1 , the time difference between the rising edge of the signal S1 and the rising edge of the signal S2 is the time interval T to be measured, and the measurement process of the time interval T to be measured is as follows:

[0032] The signal C is used as the driving signal of the delay chain and the counting clock of the coarse counter, so that the output state value of each unit of the delay chain changes; when the signal S1 arrives, the first fine counter records the delay chain at the moment when the rising edge of the signal C arrives. The output state value of each unit is latched, and the coarse counter performs an operat...

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Abstract

The invention discloses a calibration method for inherent errors of TDC time interval measurement. An existing calibration method for the inherent errors of time interval measurement may increase thecomplexity of the whole measurement system structure and is poor in reconfigurability. The method disclosed by the invention includes the following steps: designing a random signal required for code density calibration according to the source of TDC inherent errors, wherein the random signal is composed of signals with different pulse widths and is used to simulate a time interval signal to be measured with a random width in actual measurement; and testing a delay chain by using the random signal to obtain a test sample, analyzing sample data to obtain a delay chain unit bit width error, and calibrating the delay chain unit bit width error. According to the scheme of the invention, a cyclic sequence of a random sequence can be ensured on the premise of preventing deadlock, and an originalcyclic sequence can be remained unchanged on the premise of adding an all-zero state.

Description

technical field [0001] The invention belongs to the technical field of signal processing, and in particular relates to a method for calibrating inherent errors in TDC time interval measurement. Background technique [0002] High-precision time interval measurement technology has a wide range of applications in fluorescence lifetime detection, quantum communication, aerospace, high-energy physics research, global navigation systems, and high-sensitivity sensors. The main components of TDC (time measurement system) are rough measurement and fine measurement. The sources of TDC errors are mainly divided into two parts: inherent errors caused by process defects, and measurement errors caused by changes in pressure, voltage and temperature parameters. The former mostly uses improved system structure for error compensation, while the latter mostly uses searching technical manuals for error compensation. [0003] At present, there are also calibration methods for the inherent err...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F1/02G06F7/58
CPCG06F1/022G06F7/58
Inventor 张钰胡万鹏王建利
Owner 米银(杭州)信息科技有限公司
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