Mask and manufacturing method thereof
A manufacturing method and mask technology, applied in semiconductor/solid-state device manufacturing, ion implantation plating, coating, etc., can solve the problems affecting the deposition quality of organic light-emitting layers, and the quality and accuracy of metal masks cannot be well satisfied Requirements, issues affecting product quality, etc., to achieve the effect of improving restrictions, increasing robustness, and improving accuracy
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[0053] Example one
[0054] In view of the foregoing technical problems, the present invention proposes a mask, which mainly includes:
[0055] A substrate having a first surface and a second surface opposite to each other, the substrate has a plurality of openings penetrating the substrate, and the material of the substrate is a material capable of performing a semiconductor etching process;
[0056] A mask pattern layer located on the first surface, the material of the mask pattern layer is a material capable of performing a semiconductor etching process;
[0057] The mask pattern layer has a pattern area and a shielding area, each pattern area has at least one through hole, the opening exposes the pattern area, and each of the openings is opposite to and exposes the pattern area For all through holes in the pattern area, the shielding area is located outside the pattern area and opposite to the substrate.
[0058] The mask of the present invention is made by deposition, photolithogr...
Example Embodiment
[0083] Example two
[0084] The invention also provides a method for manufacturing a mask, such as Figure 7 As shown, it mainly includes the following steps:
[0085] Step S1, providing a substrate having a first surface and a second surface opposite to each other, and a mask layer is formed on the first surface of the substrate;
[0086] Step S2, according to a predetermined pattern, use a semiconductor etching process to etch the mask layer to form a mask pattern layer. The mask pattern layer has a pattern area and a shielding area, and each pattern area has at least one pass. Hole, the shielding area is located outside the graphic area;
[0087] Step S3, etching the substrate from the second surface by a semiconductor etching process to form a plurality of openings penetrating the substrate, wherein the openings expose the pattern area.
[0088] Below, reference Figure 1A to Figure 1J The manufacturing method of the mask of the present invention will be described in detail, in whic...
Example Embodiment
[0137] Example three
[0138] It is worth mentioning that in order to obtain the mask in the first embodiment, the order of the method steps in this embodiment can also be exchanged to prepare and obtain the corresponding mask, for example, in order to obtain image 3 In the mask structure, you can also perform the following steps:
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