Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Absolute distance measurement system and method based on phase method and synthetic wavelength method

A technology of synthesizing wavelength and absolute distance, applied in the field of detection, can solve the problem that the range and measurement accuracy cannot be satisfied at the same time, and achieve the effect of expanding the measurement range, improving the distance measurement accuracy and simple system structure.

Inactive Publication Date: 2018-11-02
ZHEJIANG MEASUREMENT SCI RES INST
View PDF3 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the technical problem that the measurement range and measurement accuracy cannot be satisfied at the same time in the prior art, the present invention provides an absolute distance measurement system and measurement method based on the phase method and the synthetic wavelength method, so as to expand the measurement range and improve The purpose of measuring accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Absolute distance measurement system and method based on phase method and synthetic wavelength method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0015] Such as figure 1 As shown, an absolute distance measurement system based on the phase method and the synthetic wavelength method includes: a femtosecond laser 1, a laser isolator 2, a mirror I3, a half-wave plate I4, a polarization beam splitter prism I5, a lens I6, an acoustic Optical modulator 7, lens II 8, quarter-wave plate I 9, and 0° reflector (10) are sequentially arranged to form a synthesized wavelength measurement system; it consists of reflector II 11, half-wave plate II 12, polarization beam splitting prism II 13, photoelectric detection Device I14, quarter-wave plate II15, target mirror 16, mirror III17, photodetector II18, phase meter 19, and computer 20 form a phase method measurement system. In the figure: the thin solid line of the arrow indicates the optical path, and the dotted line of the arrow indicates the electrical connection. The femtosecond laser 1 is an erbium-doped femtosecond pulsed laser with a wavelength of 1560 nm, a power of about 60 mW...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an absolute distance measurement system and method based on the phase method and the synthetic wavelength method. The output laser of a femtosecond laser is reflected by a polarization beam splitting prism I and then returned along an original path by a 0-DEG reflector after passing through an acousto-optic modulator; the reflected light is transmitted through the polarization beam splitting prism I into a polarization beam splitting prism II into two beams, one beam is a reference arm light path and is received by a photodetector I, the other beam is a measuring arm light path and is received by a photodetector II, and the photodetectors are electrically connected with a computer through a phase meter. The system and the method are advantaged in that a technical problem that the range and measurement accuracy cannot be simultaneously satisfied in the absolute distance measurement process in the prior art is solved; an erbium-doped femtosecond laser frequency comb is utilized as a light source, the pulse repetition frequency is high, and distance measurement accuracy is improved by utilizing higher harmonics; through interference between femtosecond optical comb pulses, combined with the phase method and the synthetic wavelength method, the large extended measurement range is realized; the system is simple in structure and easy to operate.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to an absolute distance measurement system and measurement method based on a phase method and a synthetic wavelength method. Background technique [0002] Distance measurement is an important aspect in the field of detection technology, especially for high-end equipment manufacturing, ship repairing, automobile manufacturing, traffic engineering construction and other fields. At present, the distance measurement methods mainly used at home and abroad are: phase method, time-of-flight method, laser interferometry and so on. The phase method is a traditional ranging method, which does not require a cooperative target and can achieve long-distance ranging. However, in large-scale measurement, the measurement accuracy is limited to the order of mm. The time-of-flight method has the advantage of measuring distances from a few meters to hundreds of kilometers. It is not only widely us...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/08
CPCG01S17/08
Inventor 陈宁郭刚祥胡朋兵张建锋
Owner ZHEJIANG MEASUREMENT SCI RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products