Semiconductor device and fabrication method thereof
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- GPOWER SEMICON
- Publication Date
- 2018-11-06
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The present invention relates to the technical field of semiconductors, in particular to a semiconductor device and a manufacturing method thereof. Background technique
[0002] GaN (gallium nitride) semiconductor devices have significant advantages such as large band gap, high electron mobility, high breakdown field strength, and high temperature resistance. Compared with the first-generation semiconductor silicon and the second-generation semiconductor gallium arsenide, it is more suitable It has broad application prospects for making high-temperature, high-voltage, high-frequency and high-power electronic devices.
[0003] In radio frequency microwave and high-voltage applications, enhanced semiconductor devices are essential, and high-voltage depletion-type AlGaN / GaN semiconductor devices and low-voltage enhanced silicon-metal-oxide-semiconductor field-effect transistors (Si-Metal-Oxide-Semiconductor Field) are often used -Effect Transistor, Si-MO...