Z scanning device adapted to ultra-short pulse ultra-continuous white light source
A super-continuous white light and scanning device technology, applied in the field of Z-scan, can solve the problems of poor signal-to-noise ratio, low power and stability of continuous white light, and achieve the effect of wide spectral bandwidth and increased power
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] The embodiment of the present invention provides a Z-scanning device adapted to the ultrashort pulse supercontinuous white light source, which solves the existing problem of using supercontinuous white light as the light source and using a spectrometer as the detector to measure within a larger wavelength range at one time. Continuous nonlinear spectral lines, but since continuous white light is mostly realized by femtosecond laser pumping liquid or solid nonlinear media, the power and stability of the generated continuous white light are usually low, resulting in the signal-to-noise ratio of the measured signal Poor and can only be used to test materials with high nonlinear effects. However, for some materials with low nonlinear effects, such as liquids with thinner concentrations and thin films, the measurement results are not ideal. In addition, most of the currently used continuous white light Z-scanning devices use a lens focusing mode. Considering the impact of t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com