Device and method for measuring repolarization rate of one-dimensional material

Abstract

The invention provides an apparatus and method for measuring the repolarization rate of a one-dimensional material. According to the method, the interference of left-(right-)rotated elliptically polarized light and scattered light of the one-dimensional material is used, and the contributions of the real parts (imaginary parts) of the repolarization rates in two groups of results are opposite (same), thereby quantitatively measuring the repolarization rate of the one-dimensional material. The device comprises a light source, a first polarizing film, a quarter wave plate, a first polarization maintaining lens, a sample of the one-dimensional material to be measured, a second polarization maintaining lens, a second polarizing film and a spectrometer. Alternatively, the apparatus includes a light source, a first polarizer, a quarter wave plate, a beam splitter, a polarization maintaining lens, a sample of the one-dimensional material to be tested, a second polarizing plate, a mirror, anda spectrometer. According to the invention, the measurement of the repolarization rate of the one-dimensional material is realized for the first time, and the device has the characteristics of high measurement speed, wide measurement frequency band (1.6 eV-2.7 eV), no damage to the sample to be measured, simple operation and easily available equipment.

Description

technical field [0001] The invention belongs to the technical fields of spectroscopy and optoelectronics, and relates to an optical method for measuring the repolarization rate of one-dimensional materials. Background technique [0002] One-dimensional materials refer to materials with two dimensions in nanometer size (size less than 100 nanometers), such as nanowires, nanorods, nanofibers, nanotubes, etc. optical repolarization It is one of the most basic parameters to characterize the interaction between materials and light, and it is of great significance to better understand the photoelectric properties and specific applications of materials. For traditional three-dimensional materials or two-dimensional thin film materials, optical repolarization can be measured by traditional diffraction or reflection ellipsometers. However, in one-dimensional material spectroscopy, there is no concept of reflection and diffraction (Snell’s equation fails), which makes it impossible...

AI Technical Summary

Problems solved by technology

However, in one-dimensional material spectroscopy, there is no concept of reflection and diffraction (Snell’s equation fails), which makes it impossible to measure the repolarization of one-dimensional materials by traditional measurement methods

On the other hand, since the integral range calculated by the Kramer-Kronig relation needs to be from 0 to positive infinity, it is theoretically impossible to accurately calculate the real part of the complex susceptibility information

Up to now, there has been no report on the technology of measuring the optical repolarization of one-dimensional materials at home and abroad. Therefore, it is particularly important to develop a technology that is widely used to measure the optical repolarization of one-dimensional materials.

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