Atom hyperfine structure measuring apparatus and atom hyperfine structure measuring method

Abstract

The invention belongs to the field of optical frequency measurement, and provides an atom hyperfine structure measuring apparatus with simple structure and an atom hyperfine structure measuring method. The apparatus comprises a first laser, an atom sample pool, a magnetism shielding case, a splitting flat sheet, a photoelectric detector, a radio frequency driving source, a plane mirror, an acousto-optic modulator system and a second laser. The laser emitted by the first laser is received by the photoelectric detector after passing through the atom sample pool and the splitting flat sheet; thelaser emitted by the second laser sequentially passes through the acousto-optic modulator system, the plane mirror and the splitting flat sheet, falls on the atom sample pool and is reversely overlapped with the laser emitted by the first laser at the atom sample pool; the laser frequency of the first laser is resonant with the ground state energy level |1> of the to-be-measured atom to the excited state energy level |2>, and the laser frequency of the second laser is located near the resonance transition of the atom excited state energy level |2> to the to-be-measured excited state energy level |3>; and the acousto-optic modulator system is connected with the radio frequency driving source. According to the atom hyperfine structure measuring apparatus and the atom hyperfine structure measuring method, accurate measurement of the atom hyperfine structure can be realized.

Description

technical field [0001] The invention belongs to the technical field of optical frequency measurement, and in particular relates to a device and method for measuring atomic hyperfine structure. Background technique [0002] The measurement of atomic ultrafine structure plays an important role in charge interaction, atomic parity violation, precise measurement of fundamental physical constants, high-resolution spectroscopy and optical frequency standards, etc. At present, the commonly used methods for the measurement of spectral hyperfine structure include Fabry-Perot cavity, electro-optic modulator, optical frequency comb, etc. When the Fabry-Perot interference cavity is used to measure the frequency, its accuracy is limited due to its own thermal fluctuations and mechanical vibrations, so the measurement results will have large errors, and the usual accuracy is 10 -4 ; When using electro-optic modulators to measure frequency, the complexity of the system is increased due to...

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problems of low measurement accuracy, complex measurement system and high measurement cost in the prior art, the present invention provides a device for measuring atomic ultrafine structure with high precision and simple structure

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