Device and method for measuring high-energy electrons and electromagnetic radiation under long gap discharge

A technology of high-energy electrons and electromagnetic radiation, which is applied in the direction of using optical methods for testing and testing dielectric strength, etc., can solve the problems of unsatisfactory X-ray generation, high cost of array structure, immature devices and methods, etc., and achieve structural Simple, low cost, great economic benefits

Pending Publication Date: 2019-02-15
CHINA ELECTRIC POWER RES INST +3
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, the X-ray detector array of the scintillator group in the patent No. CN 103959098A can better reflect the space-time distribution of X-rays, but it adds an X-ray absorption function in the packaging structure to shield the X-rays from affecting the electronic circuit. Influence, and this will affect the experimental results in the discharge experiment, and the cost of the array structure is high, and the X-ray detection array manufactured in a small area cannot satisfy the X-ray generation conditions at different positions under the long gap
At present, there are few studies on long-gap discharge, and the devices and methods used are relatively immature

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring high-energy electrons and electromagnetic radiation under long gap discharge
  • Device and method for measuring high-energy electrons and electromagnetic radiation under long gap discharge

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] Exemplary embodiments of the present invention will now be described with reference to the drawings; however, the present invention may be embodied in many different forms and are not limited to the embodiments described herein, which are provided for the purpose of exhaustively and completely disclosing the present invention. invention and fully convey the scope of the invention to those skilled in the art. The terms used in the exemplary embodiments shown in the drawings do not limit the present invention. In the figures, the same units / elements are given the same reference numerals.

[0035] Unless otherwise specified, the terms (including scientific and technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it can be understood that terms defined by commonly used dictionaries should be understood to have consistent meanings in the context of their related fields, and should not be understood as idealized or over...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a device and a method for measuring high-energy electrons and electromagnetic radiation under long gap discharge, which belong to the technical field of long gap discharge. Thedevice of the invention includes a discharge experiment part and a detection part. The discharge experiment part includes an impulse voltage generator, a voltage divider and a needle-plate dischargestructure. The detection part includes a scintillator probe group, a DC power supply, a linear amplifier, a multi-channel analyzer, a processor, a run-away electron beam collector and an oscilloscope.The device and the method have the characteristics of simple structure and low cost, can ensure smooth conduction of experiment, can be used to guide insulation protection under lightning overvoltageand impulse overvoltage, and can bring great economic benefits. The device and the method can improve the accuracy of space-time characterization of long gap discharge, and are helpful to promote thebasic theoretical research about long gap discharge.

Description

technical field [0001] The invention belongs to the technical field of long-gap discharge, and in particular relates to a measuring device and method for high-energy electrons and electromagnetic radiation under long-gap discharge. Background technique [0002] Long gap discharge is the basis of external insulation design and lightning shielding design, and it is used for the research of discharge characteristics and lightning shielding characteristics under lightning impulse overvoltage and power frequency overvoltage. As an important form of discharge, the mechanism of long-gap discharge is obviously different from that of short-gap discharge, which cannot be explained by the widely used Townsend theory and streamer theory. Long-gap discharge has short transient process, high discharge voltage, accompanied by various physical phenomena such as electricity, light, sound, heat, etc. The discharge is affected by many factors, and the discharge mechanism is complex. Due to th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12
CPCG01R31/1218
Inventor 丁玉剑邵涛章程邱锦涛贺恒鑫庄池杰姚修远
Owner CHINA ELECTRIC POWER RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products