Sample grinding device

A technology of grinding samples and grinding discs, which is applied in the direction of grinding drive devices, measuring devices, grinding machines, etc., can solve problems such as over-grinding or grinding skew, and achieve the effects of avoiding skew, ensuring regular shape, and improving the quality of grinding samples

Inactive Publication Date: 2019-02-19
XI'AN POLYTECHNIC UNIVERSITY
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  • Claims
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AI Technical Summary

Problems solved by technology

[0005] In order to solve the above problems, the object of the present invention is to propose a sample grinding device, which solves the problem of over-grinding or grinding obliqueness in the manual grinding process, realizes the precise control of the size of the dielectric parameter test sample, and greatly improves the Improve the accuracy of the dielectric parameter test; at the same time, when the sample to be tested is a loose and brittle coating, the standardization and normalization of the sample preparation process of the dielectric parameter test sample is avoided, and the sample preparation process is avoided during the sample grinding process. damage to

Method used

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Embodiment Construction

[0038] refer to Figure 1-Figure 3, a sample grinding device provided by an embodiment of the present invention, comprising two H-shaped brackets 1 and a grinding disc, the two H-shaped brackets 1 are symmetrically arranged on the left side and the right side of the grinding disc 5 Two crossbeams 2 are arranged on the upper end of the crossbeam 2, and sliding parts 3 are erected between the two crossbeams 2, and the sliding parts 3 move left and right along the crossbeams 2; The lower end of the pressing part 4 is provided with an elastic clamping part 401, and the sample 6 to be ground is inside the elastic clamping part 401; the first sliding rod 101, the second sliding rod 102, the first sliding rod 101, the second sliding rod 102, The third sliding bar 103 and the fourth sliding bar 104, the first sliding bar 101 and the second sliding bar 102 are located on the same horizontal plane, the third sliding bar 103 and the fourth sliding bar 104 are located on the same horizont...

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Abstract

The invention discloses a sample grinding device. The device comprises two H-shaped supports and a grinding disc, two cross beams are arranged at the upper ends of the two H-shaped supports, a slidingcomponent is erected between the two cross beams, and can move left and right, a downward pressing component is arranged on the sliding component, an elastic clamping part is arranged at the lower end of the downward pressing component, a sample to be ground is arranged in the elastic clamping part, a first sliding rod, a second sliding rod, a third sliding rod and a fourth sliding rod are horizontally arranged between the two H-shaped supports in a front and back manner, connecting parts are horizontally arranged between the first sliding rod and the sample to be ground, between the second sliding rod and the sample to be ground, between the third sliding rod and the sample to be ground and between the fourth sliding rod and the sample to be ground, the grinding disc is arranged betweenthe sample to be ground, and a grinding sample is arranged on the grinding disc; the problem of excessive grinding or inclined grinding in the manual sample grinding process can be solved, accuracy ofdielectric parameter testing can be improved, standardization and normalizing of the sample testing process tested by dielectric parameters of the sample to be tested of the loose structure can be achieved, and the damage to the sample in the sample grinding process can be avoided.

Description

technical field [0001] The invention relates to the technical field of electromagnetic shielding materials, in particular to a sample grinding device. Background technique [0002] With the rapid entry of electronic products into people's lives, electromagnetic wave pollution follows, so the research and development of electromagnetic shielding materials is particularly important. Dielectric properties refer to the properties of storing and dissipating electrostatic energy under the action of an electric field, usually expressed by dielectric constant and dielectric loss. The dielectric properties of materials directly characterize the electromagnetic shielding performance of materials. Therefore, for The study of the dielectric properties of materials is the key to solve the problem of electromagnetic shielding. [0003] The dielectric properties refer to the response characteristics of the bound charges in the substance molecules to the applied electric field, usually mai...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B24B19/22B24B41/02B24B41/06B24B47/12G01N1/28
CPCB24B19/22B24B41/02B24B41/06B24B47/12G01N1/286G01N2001/2866
Inventor 刘毅徐杨苏晓磊贺辛亥徐洁屈银虎王俊勃付翀王彦龙
Owner XI'AN POLYTECHNIC UNIVERSITY
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