Method and device for erasing nor-type flash memory
A flash memory and over-erasing technology, which is applied in the direction of information storage, static memory, read-only memory, etc., can solve the problems of increasing time, long programming operation time, and increasing the number of erasing operations, so as to improve the operating speed and reduce the Erasing time, effect of shortening erasing time
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Embodiment 1
[0034] figure 1 A schematic flow chart of a method for erasing a NOR flash memory provided by an embodiment of the present invention, the method can be performed by an erasing device for a NOR flash memory, wherein the device can be implemented by hardware and / or software, specifically including the following step:
[0035] Step 110, performing erasure verification on the storage unit.
[0036] In NOR flash memory, the time to erase a fixed-capacity storage unit is often one of the important performances of the memory, because the speed of erasing a fixed-capacity storage unit has a great impact on the operating speed of the memory. After the traditional erase operation, two verification operations are generally included: Over Erase Verify (OEV) and Erase Verify (EV). The main function of the over-erase verification operation is to avoid the problem that the threshold voltage of the erased memory cell is too low. For a memory cell that does not pass the overerasable verific...
Embodiment 2
[0045] figure 2 It is a schematic flowchart of a method for erasing a NOR flash memory provided by an embodiment of the present invention. On the basis of the above-mentioned embodiments, this embodiment specifically refines the judging process of over-erase verification and erasure verification, and determines the erase pulse signal according to the number of programming operations, and indicates an increase or decrease according to the erase pulse signal The specific steps for the preset erasing time of the erasing operation have been refined. Such as figure 2 As shown, the method specifically includes the following steps:
[0046] Step 210, performing erasure verification on the storage unit.
[0047] Step 220, read the threshold voltage of the memory cell, if the threshold voltage of the memory cell is less than the threshold voltage of the over-erased state, the memory cell has not passed the over-erased verification, perform a programming operation on the memory cel...
Embodiment 3
[0058] image 3 Shown is a schematic structural diagram of a device for erasing a NOR flash memory provided by Embodiment 3 of the present invention. The device can be implemented by hardware, such as image 3 As shown, the device includes:
[0059] The over-erasure verification module 310 is configured to perform erasure verification on the storage unit.
[0060] The programming module 320, the programming module 320 is connected with the over-erase verification module 310, and is used to perform at least one programming operation on the memory cells that have not passed the over-erasure verification.
[0061] The time controller 330, which is connected to the programming module 320, is used to record the number of programming operations, and determine the erase pulse signal according to the number of programming operations.
[0062] The erasure verification module 340 is connected to the over-erase verification module 310, and is used to perform erasure verification on mem...
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