Detecting device and detecting method for dark field cofocal subsurface based on coaxial two conical lenses
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2019-03-15
- Estimated Expiration
- Not applicable · inactive patent
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Figure 1
Abstract
Description
technical field
[0001] The present invention relates to the technical field of optical precision measurement, and more specifically relates to a dark-field confocal subsurface non-destructive testing device and method based on a coaxial biconical lens with a variable duty ratio, which can realize the transformation from a common confocal microscope system to a dark field. Transformation of the field confocal microscopy system to achieve precise measurement of subsurface damage. Background technique
[0002] With the rapid development of modern science and technology, optical materials have been widely used, especially in cutting-edge science such as aerospace, national defense, military industry, information, microelectronics and optoelectronics, and become an indispensable and important material. The application of optical components is becoming more and more widespread, and higher requirements are put forward for the surface quality of optical components. This requires the...