Detecting device and detecting method for dark field cofocal subsurface based on coaxial two conical lenses

A conical lens and detection device technology, which is applied in the direction of optical testing flaws/defects, etc., can solve the problems of non-adjustable duty cycle, large energy loss, low signal-to-noise ratio, etc. Minimal loss, the effect of increasing light intensity

Inactive Publication Date: 2019-03-15
HARBIN INST OF TECH
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Problems solved by technology

[0006] In view of this, the present invention provides a dark-field confocal subsurface detection device and method based on a coaxial biconical lens, which solves the problem of low signal-to-noise ratio and the occupation of a blocking ring light generator in the detection of subsurface damage by common confocal microscopy techniques. The problem of non-adjustable air ratio and large energy loss

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  • Detecting device and detecting method for dark field cofocal subsurface based on coaxial two conical lenses

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0035] The embodiment of the invention discloses a dark field confocal subsurface detection device and method based on a coaxial biconical lens.

[0036] Wherein, the dark-field confocal microscopy device includes an illumination system and a detection system;

[0037] The lighting system includes a point light source 1, a collimating mirror 2, a beam expander 3, a conical lens 4, a conical lens 2 5, an optical guide rail 6, a dichroic prism 7 and an objective...

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Abstract

The invention discloses a detecting device and a detecting method for dark field cofocal subsurface based on two coaxial conical lenses. Light emitted by a point light source passes through a collimating lens to form parallel light; the parallel light sequentially passes through a beam expander, a conical lens I and a conical lens II to form ring light; the ring light is converged to a to-be-tested sample by a beam splitting prism and an objective lens; reflected light and scattered light which are emitted by the to-be-tested sample pass through the objective lens and the beam splitting prismsequentially and enter a detection complementary diaphragm; the reflected light is shielded by the detection complementary aperture; the scattered light passes through the detection complementary diaphragm, a collecting lens and a detection pinhole sequentially and enters a photoelectric detector. The ring light illumination with adjustable duty factor is realized by adopting a beam expander and one group of symmetrically-putted coaxial conical lenses; dark field cofocus is realized by in combination with the detection complementary diaphragm; the problems of low signal-noise ratio, non-adjustable duty ratio of a shield type ring optical generator and great energy loss in the detection of the subsurface by an ordinary cofocal microtechnique are solved; the detecting device and the detecting method are suitable for subsurface nondestructive testing.

Description

technical field [0001] The present invention relates to the technical field of optical precision measurement, and more specifically relates to a dark-field confocal subsurface non-destructive testing device and method based on a coaxial biconical lens with a variable duty ratio, which can realize the transformation from a common confocal microscope system to a dark field. Transformation of the field confocal microscopy system to achieve precise measurement of subsurface damage. Background technique [0002] With the rapid development of modern science and technology, optical materials have been widely used, especially in cutting-edge science such as aerospace, national defense, military industry, information, microelectronics and optoelectronics, and become an indispensable and important material. The application of optical components is becoming more and more widespread, and higher requirements are put forward for the surface quality of optical components. This requires the...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/88
Inventor 刘俭刘婧王宇航刘辰光谭久彬
Owner HARBIN INST OF TECH
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