Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

KIDs detector noise test circuit based on active quadrature mixer and test method thereof

A detector noise and quadrature mixer technology, which is applied in the field of terahertz/optical technology research, can solve the problems of large DC bias voltage, amplitude and phase imbalance at the intermediate frequency output end, and complicated quadrature mixers, etc. Reduced common-mode noise interference, accurate noise measurements, excellent amplitude/phase balance, and port isolation

Active Publication Date: 2019-03-15
ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the two quadrature IF output terminals of passive quadrature mixers generally have amplitude and phase imbalances, and the specific values ​​change with frequency, which makes the calibration of quadrature mixers a complicated and demanding task. high process
In addition, microwave passive quadrature mixers require large LO excitation levels
On the one hand, this puts forward higher requirements on the output power level of the frequency synthesis source. On the other hand, it also causes a large parasitic DC bias voltage at the output terminal of the intermediate frequency, which limits the multiple of DC amplification and the dynamics of the analog-to-digital conversion sampling circuit. scope

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • KIDs detector noise test circuit based on active quadrature mixer and test method thereof
  • KIDs detector noise test circuit based on active quadrature mixer and test method thereof
  • KIDs detector noise test circuit based on active quadrature mixer and test method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to clarify the technical solution of the present invention, the present invention will be further introduced below in conjunction with the accompanying drawings and specific implementation.

[0037] Such as figure 1 As shown, a KIDs detector noise test circuit based on an active quadrature mixer, including a frequency synthesis source 1, a directional coupler 2, a KIDs detector readout circuit module 3, an adjustable phase shifter 4, an active The frequency mixing circuit module 5, filter circuit module, data acquisition card 8 and control computer are components whose main function is to realize the amplitude and phase noise measurement of the KIDs detector chip.

[0038] The signal output terminal of the frequency synthesis source 1 is connected with the directional coupler 2, and its output signal is divided into two paths by the directional coupler 2, and the two output terminals of the directional coupler 2 are respectively connected with the KIDs detector...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Noise figureaaaaaaaaaa
Login to View More

Abstract

The invention provides a KIDs detector noise test circuit based on an active quadrature mixer and a test method thereof. The test circuit is characterized in that the test circuit comprises a frequency synthesis source, a directional coupler, a KIDs detector readout circuit module, an adjustable phase shifter, an active mixing circuit module, a filter circuit module, a data acquisition card, a control computer and the like. The test circuit takes a broadband Gilbert double-balance active quadrature mixer circuit structure as a core module, can complete noise test work on KIDs detector chips, and has excellent amplitude / phase balance degree and port isolation degree. The parasitic direct current bias voltage generated by a frequency output port is weak, the measurement is accurate, the mixer does not need to be separately calibrated, the measurement process is simplified, and the power level of the frequency synthesis source is reduced at the same time.

Description

technical field [0001] The invention relates to a KIDs detector noise test circuit and a test method based on an active quadrature mixer, belonging to the field of terahertz / optical technology research. Background technique [0002] Superconducting dynamic inductance detectors (Kinetic Inductance Detectors, KIDs) are a new type of low-temperature high-sensitivity detectors, which can be used for target imaging observations from millimeter wave to terahertz, optical / ultraviolet, X-ray, and γ frequency bands. The core circuit of the KIDs detector is mainly composed of a photon signal receiver and a microwave resonator. According to the working principle of KIDs, when an external radio frequency signal irradiates the KIDs detector, the superconducting Cooper pair rupture occurs after the receiver receives photon energy. , will lead to changes in the dynamic resistance and dynamic inductance of the microwave resonator, thus causing changes in the characteristics (Q factor, ampli...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R29/26
CPCG01R29/26
Inventor 杨瑾屏史生才林镇辉段文英李婧李升胡洁石晴吕伟涛李陟
Owner ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products