Three-dimensional form inversion method based on optical measurement
A three-dimensional shape, optical measurement technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of three-dimensional shape, inversion and reconstruction of the overall structure that have not yet been realized, and achieve simple shape inversion algorithm, simple layout, and measurement. The effect of a small number of points
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0036] The specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0037] The overall technical scheme of the present invention is as figure 1 As shown, it specifically includes the following implementation steps:
[0038] Step 1: Use the finite element method or test method to conduct modal analysis on the flexible structure under test to obtain the main mode shape Ψ of the structure.
[0039] Step 2: Use the layout optimization method to optimize the number and position of PSDs and gyroscopes, obtain the positions of some feature points of the structure, and arrange sensors.
[0040] The specific optimization criterion and optimization algorithm can be selected according to the specific task requirements, such as the optimization criterion can choose shape reconstruction error, condition number criterion, modal confidence criterion, etc., and the optimization algorithm can choose genetic algori...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com