Method and system for rigid surface contact process analysis based on image control point registration
A process analysis system and surface contact technology, applied in image analysis, image enhancement, graphic image conversion, etc., can solve the problems of difficult to obtain contact area and contact process, achieve short calculation time, high efficiency, and overcome long calculation time. Effect
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[0032] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0033] The contact surface difference between the two rigid surfaces is small, and the contact process is difficult to measure directly. In order to avoid direct measurement of the contact process, the present invention proposes a rigid surface contact process analysis method based on image control point registration. By measuring the high-definition point cloud data of the two surfaces and converting them into grayscale images, the surface difference between the two surfaces is calculated by the image ...
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