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Filter, test system and filter preparation method

A test system and filter technology, which is applied in the field of photoelectric detection, can solve the problems of inability to filter high-frequency signals, and achieve the effects of saving filter space, low cost, and low production difficulty

Pending Publication Date: 2019-05-03
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a filter, a test system and a preparation method of the filter, which are used to solve the problem that the filter system in the prior art cannot effectively filter high-frequency signals

Method used

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  • Filter, test system and filter preparation method
  • Filter, test system and filter preparation method
  • Filter, test system and filter preparation method

Examples

Experimental program
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Effect test

Embodiment 1

[0075] see Figure 1 to Figure 4 , the present invention provides a filter 1, the filter 1 includes: a helical coil 11, the helical coil 11 includes several twisted pairs, wherein half of the twisted pairs are wound in a clockwise direction, The winding direction of the remaining twisted pairs is counterclockwise, that is, the winding direction of half of the twisted pairs is clockwise, and the winding direction of the other half of the twisted pairs is counterclockwise; the shielding box 12 , the shielding box 12 includes a box body 121 and a cover body 125; wherein, a housing groove 122 is formed in the box body 121, and a channel communicating with the housing groove 122 is formed on the side wall of the box body 121. Holes 123; the spiral coil 11 is located in the receiving groove 122; the cover body 125 is sealed on the box body 121; an adapter, the adapter includes a first adapter 131 and a second adapter 132 wherein, the first adapter 131 is located outside the box bod...

Embodiment 2

[0089] Please combine Figure 1 to Figure 4 refer to Figure 7 , the present invention also provides a method for preparing a filter. The filter prepared by the method for preparing a filter described in this embodiment may be, but not limited to, the filter described in Embodiment 1. The filter The preparation methods include:

[0090] 1) Prepare a helical coil, the helical coil includes several twisted pairs, wherein half of the twisted pairs are wound in a clockwise direction, and the remaining twisted pairs are wound in a counterclockwise direction;

[0091] 2) Provide a shielding box, the shielding box includes a box body and a cover body; wherein, a receiving groove is formed in the box body, and a through hole communicating with the receiving groove is formed on the side wall of the box body; placing the helical coil in the containing groove;

[0092] 3) using an adapter to connect to both ends of the helical coil respectively, so as to lead the helical coil out of t...

Embodiment 3

[0108] Please combine Figure 1 to Figure 4 refer to Figure 8 to Figure 9 , the present invention also provides a test system, the test system may include but not limited to a comprehensive physical property test system (PPMS), the test system may include: a low temperature chamber 2; a dilution refrigerator (not shown), the The dilution refrigerator is located in the low-temperature chamber 2, and the dilution refrigerator includes a high-temperature end 31 and a low-temperature end 32, and the high-temperature end 31 is electrically connected to the low-temperature end 32; the sample to be tested 4, the sample to be tested 4 is located in the low temperature chamber 2; a sample holder 5, the sample holder 5 is located in the low temperature chamber 2, and the sample holder 5 is electrically connected to the sample to be tested 4; the first filter 61, the The first filter 61 is located between the sample holder 5 and the sample to be detected 4, and is electrically connecte...

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Abstract

The invention provides a filter, a test system and a filter preparation method. The filter comprises a spiral coil, a shielding box, an adapter, and shielding powder, wherein the spiral coil comprisesa plurality of twisted pairs, the winding direction of half of the twisted pairs is a clockwise direction, and the winding direction of the rest twisted pairs is a counter-clockwise direction; the shielding box comprises a box body and a cover body; an accommodating groove is formed in the box body, and a through hole communicated with the accommodating groove is formed in the side wall of the box body; the spiral coil is arranged in the accommodating groove; the cover body covers the box body; the adapter comprises a first adapter and a second adapter; the first adapter is located outside the box body, and is electrically connected to one end of the spiral coil by means of the through hole; the second adapter is located outside the box body, and is electrically connected to the other endof the spiral coil by means of the through hole; and the shielding powder covers the spiral coil and fills up the accommodating groove. The filter provided by the invention can filter and remove high-frequency signals in the test system; and the shielding box can shield the magnetic interference of an external magnetic signal on the spiral coil, thereby avoiding the influence on a test signal.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection, and in particular relates to a filter, a test system and a preparation method of the filter. Background technique [0002] Research developments in superconducting physics are increasingly dependent on new superconducting devices, and correspondingly most superconducting devices need to be tested at lower temperatures and in less noisy environments. However, when extremely low temperature is reached, the weak high-frequency signals and electromagnetic signals in the environment will cause huge interference to the test, especially when the material is near the zero temperature state, a lot of physical information is covered up, so an effective filter is urgently needed The system helps resolve signal interference issues. At present, most of the common filters are low-frequency filters including PI filters, and conventional test systems cannot effectively shield high-frequency sign...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01F17/02H01F27/28H01F27/29H01F27/36H01F41/073H01F41/10H01F41/00G01R31/26
Inventor 谢晓明吴宇峰韩晓雯胡涛高敏钱浩吉
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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