Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wiring method and testing method of fpga wiring resources

A technology of wiring method and test method, applied in the direction of instrument, calculation, electrical digital data processing, etc., can solve the problems of long test time of FPGA wiring resources and unbalanced utilization of FPGA resources, so as to shorten the test time of FPGA and reduce the number of Effect

Active Publication Date: 2021-03-30
SHANGHAI ANLOGIC INFOTECH CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The disadvantage of the existing FPGA wiring resource testing method is that the utilization rate of FPGA resources is unbalanced, so the number of test pats required for wiring resource testing is relatively large, and the FPGA wiring resource testing time is relatively long

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wiring method and testing method of fpga wiring resources
  • Wiring method and testing method of fpga wiring resources
  • Wiring method and testing method of fpga wiring resources

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] In the following description, many technical details are proposed in order to enable readers to better understand the application. However, those skilled in the art can understand that the technical solutions claimed in this application can be realized even without these technical details and various changes and modifications based on the following implementation modes.

[0050] Explanation of some concepts:

[0051] 1.FPGA: Field Programmable Gate Array, Field Programmable Logic Array. It emerged as a semi-custom circuit in the field of application-specific integrated circuits, which not only solves the shortcomings of full-custom circuits, but also overcomes the shortcomings of the limited number of gates in the original programmable logic device.

[0052] 2.PLB: Programmable Logic Block, programmable logic module. Is the basic unit of FPGA, such as Figure 7 As shown, it includes a wiring switch array RSB and a logic unit PFB.

[0053] 3. RSB: Routing Switch Box....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an integrated circuit test, and discloses a wiring method and a testing method of wiring resources of an FPGA. The wiring method specifically comprises the following steps ofselecting a direction; executing the wiring process of a unit step length sequentially from each row or each column of the starting wiring unit to each row or each column of the ending wiring unit, and executing the wiring process of the unit step length once from each row or each column of the starting wiring unit in a direction opposite to the selected direction. The testing method is used for testing the distributed tested line segments on the basis of the wiring method. According to the embodiment of the invention, the existing FPGA logic resources can be utilized in a balanced manner, thewiring channels are tested as much as possible in one test pad, the number of test pads required by FPGA wiring resource testing is reduced, the FPGA testing time is shortened, and the test pad development time is shortened.

Description

technical field [0001] The present application relates to the field of integrated circuit testing, in particular to a routing technology and testing technology of FPGA routing resources. Background technique [0002] The wiring resources connect all units inside the FPGA, and the length and process of the connection determine the driving capability and transmission speed of the signal on the connection. There are abundant wiring resources inside the FPGA chip. In practice, designers do not need to directly select wiring resources. The placer and router can automatically select wiring resources according to the topology and constraints of the input logic netlist to connect each module unit. The wiring resources are An important part of the FPGA, the connectivity of the FPGA's routing resources directly affects the specific functions of the FPGA, so the testing of the FPGA's routing resources is particularly important. [0003] The disadvantage of the existing FPGA routing re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/347
Inventor 郑莉
Owner SHANGHAI ANLOGIC INFOTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com