Method and imaging system for reducing fixed pattern noise of image sensor pixel array

An image sensor, imaging system technology, applied in the field of image sensors, can solve problems such as changes

Active Publication Date: 2019-06-21
思特威(上海)电子科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although fixed image noise does not change significantly during photon capture, it does vary with integration time, image sensor temperature, image sensor gain, and incident illumination

Method used

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  • Method and imaging system for reducing fixed pattern noise of image sensor pixel array
  • Method and imaging system for reducing fixed pattern noise of image sensor pixel array
  • Method and imaging system for reducing fixed pattern noise of image sensor pixel array

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Embodiment Construction

[0100]The above figures illustrate the present invention, which is an image sensor comprising pixel cells with signal noise reduction elements and selectable rolling exposure and global exposure readout modes. Several embodiments of image sensors are disclosed herein. In the following description, numerous specific details are set forth in order to facilitate a thorough understanding of the present invention. However, those skilled in the relevant art should understand that the technical content described in the present invention can be implemented without specific details or other methods, components, materials, and the like. In other instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring the specific matter.

[0101] A substrate can have a front side and a back side. Any processing operation performed from the front can be regarded as a front operation, while the operation performed from the back can be regarded a...

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Abstract

The invention relates to a method and imaging system for reducing fixed image noise of an image sensor pixel array. An image sensor has a stacked pixel cell array including both rolling and global shutter readout circuits, wherein each pixel unit includes an adjustable transfer transistor gate voltage level for modifying electric charge within a photodiode during exposure depending on incident light intensity. The image sensor also has a row decoder circuit providing readout signals to each row of the imaging cells during both a readout interval and during a calibration interval for each row.The row decoder may employ one of several of its features to provide a self-knee point calibration following an image signal readout in order to minimize photo conversion variations that lead to fixedpattern noise and to enhance a dynamic range.

Description

technical field [0001] The invention relates to the technical field of image sensors, in particular to a CMOS image sensor imaging system with a stacked chip structure. The bottom chip includes an array of photosensitive regions and structures for acquiring images, and the top chip includes circuit elements for acquiring images from the array. The image sensor can be applied in digital cameras. Background technique [0002] An image acquisition device generally includes an image sensor and a lens. The lens focuses light onto the image sensor to form an image, and the image sensor converts the light signal into an electrical signal. Electrical signals are output from the image acquisition device to other components of the electronic system. The image acquisition device and other components of the electronic system make up the imaging system. Image sensors have been widely used and can be found in various electronic systems, such as mobile phones, digital cameras, medical ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/374H04N5/365
CPCH04N25/575H04N25/778H04N25/77H04N25/79H04N25/63H04N25/65H04N25/75H04N25/713
Inventor 徐辰莫要武马伟剑邵泽旭
Owner 思特威(上海)电子科技股份有限公司
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