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Total reflection method-based actual contact area measuring instrument

A contact area and total reflection method, applied in the field of mechanical applications, can solve the problems of inability to observe the dynamic changes of the actual contact area, high requirements for ambient light, and high requirements for the production of test pieces, achieving simple structure, high measurement accuracy, and easy capture. Effect

Inactive Publication Date: 2019-06-25
XI AN JIAOTONG UNIV
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the existing devices use X-ray tomography technology or ultrasonic detection technology, as well as general optical observation. X-ray tomography equipment is expensive and has high requirements for the production of test pieces. Ultrasonic detection technology cannot observe the actual contact area due to the influence of scanning time. The dynamic changes of the general optical observation have high requirements on the ambient light, and the area with a small actual contact area cannot be accurately photographed. It is better to measure the soft material with a large actual contact area, but it is better to observe the hard material with a small actual contact area. poor

Method used

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  • Total reflection method-based actual contact area measuring instrument
  • Total reflection method-based actual contact area measuring instrument
  • Total reflection method-based actual contact area measuring instrument

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Embodiment Construction

[0034] The technical solutions of the present invention will be further described below in conjunction with specific implementation examples.

[0035] The invention solves two main technical problems: first, when the experimental material is subjected to a pressure load, the actual contact area can be directly observed and measured by the instrument. Second, under the action of dynamic pressure, the experimental material can use this instrument to observe the evolution of the actual contact area in real time.

[0036] see figure 1 , the present invention includes a total reflection contact disk 6 for placing experimental materials, the total reflection contact disk 6 is placed on the platform 5, and a loading device for applying a pressure load to the experimental materials is also provided on the platform 5, and the loading device includes a The support on the platform 5 is provided with a lead screw structure, the lead screw structure includes a vertically arranged lead scr...

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Abstract

The invention discloses a total reflection method-based actual contact area measuring instrument, which comprises a total reflection contact disc for placing an experiment material; the total reflection contact disc is placed on a platform; a loading device for applying pressure load to the experiment material is also arranged on the platform; the total reflection contact disc comprises a transparent plate clamp lower cover; the transparent plate clamp lower cover is provided with a stepped hole; the stepped hole is internally provided with a transparent optical glass plate; the periphery of the transparent optical glass plate is provided with a circle of monochromatic light strip; the stepper hole is provided with a transparent plate clamp upper cover; and a CCD camera for photographing the experiment material is arranged below the transparent optical glass plate. By using a total reflection principle, light is scattered in an actual contact area, the contrast with a non-contact areais high, the measurement precision is higher, and the evolutionary observation of the actual contact area is more remarkable.

Description

technical field [0001] The invention belongs to the application field of mechanics, relates to an instrument, in particular to an actual contact area measuring instrument based on a total reflection method. Background technique [0002] In contact mechanics, the measurement of the actual contact surface of the contact surface has always been a difficult point. From a macroscopic view, the smooth and flat surface is observed under a microscope, but it shows that the surface is composed of many irregular peaks and valleys, which are formed during the surface processing and cannot be avoided. When the two surfaces are in contact, only some independent points scattered on the surface are actually in contact. The surface contact area seen from the macroscopic view is called the nominal contact area, and the area of ​​the contact points scattered on the surface that actually contacts is called is the actual contact area. Even under relatively high contact pressure, the actual co...

Claims

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Application Information

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IPC IPC(8): G01B11/28
Inventor 李磊涛梁轩铭邢宇哲王刚锋
Owner XI AN JIAOTONG UNIV
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