Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Micro-range measurement method based on Fraunhofer diffraction

A Fraunhofer and measurement method technology, applied in the direction of measuring devices, image data processing, instruments, etc., can solve the problems that cannot be solved, the calculation of source light intensity is extremely demanding, consumes a lot of time and computer computing power, and achieves Computationally efficient effects

Inactive Publication Date: 2019-06-28
BEIJING JIAOTONG UNIV
View PDF10 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] According to the existing theoretical level, it is impossible to inversely deduce the occurrence conditions of diffraction from the diffraction image, because the inverse operation process involves a large number of partial differential equation solving problems, and the calculation needs to consume a lot of time and computer computing power, and there are It is very likely that it cannot be solved. In addition, its requirements for calculating the light intensity of the source are extremely demanding, which is not a level that ordinary cheap CMOS can detect

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Micro-range measurement method based on Fraunhofer diffraction
  • Micro-range measurement method based on Fraunhofer diffraction
  • Micro-range measurement method based on Fraunhofer diffraction

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0044] An embodiment of the present invention provides a macro-distance measurement method based on Fraunhofer diffraction. In this method, a Fraunhofer diffraction image acquisition device collects a diffraction image, and then measures the impact of the light wave itself on a tiny obstacle or small The diffraction phenomenon generated by the hole is inversely calculated to obtain the size of the obstacle or small hole.

[0045] Fraunhofer diffraction occurs when light waves encounter obstacles or slits close to their wavelengths, forming a specific diffraction pattern. Based on the Fraunhofer diffraction formula, the size of obstacles or slits can also be deduced from the obtained diffraction pattern.

[0046] like figure 1 As shown, the diffraction image acquisition device used in the embodiment of the present invention includes a laser 1, a polarizer 2, a beam expander 3, a first convex lens 4, a holder 5, a second convex lens 6 and A photosensitive element 7; the laser ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention, which belongs to the technical field of measuring the diffraction width by diffraction of light, provides a micro-range measurement method based on Fraunhofer diffraction. Color information at a light intensity peak of a diffraction image, a light intensity value mode, the position of a peak point, and corresponding row and column vectors are obtained by using a maximum value searchfunction being find function; a theoretical diffraction curve is generated based on the color information at the light intensity peak, the row and column vectors of the peak point, and a diffractionequivalent focal length and exploration is performed; and the diffraction width of a diffraction object generating Fraunhofer diffraction is explored continuously based on a pseudo-dichotomy algorithmand an optimal theoretical diffraction curve is determined finally, so that the diffraction width corresponding to the optimal theoretical diffraction curve is an actual diffraction width. Therefore,the diffraction width value of the diffraction occurence can be obtained based on the Fraunhofer diffraction image and the calculation efficiency is high.

Description

technical field [0001] The invention relates to the technical field of measuring diffraction width by light diffraction, in particular to a macro-distance measurement method based on Fraunhofer diffraction. Background technique [0002] In optics, Fraunhofer diffraction (named after Joseph von Fraunhofer), also known as far-field diffraction, is a type of wave diffraction that occurs when a field wave passes through a circular hole or slit, resulting in the observed The size of the image changes, which is caused by the far-field position of the observation point and the nature of the diffracted wave going out through the circular hole or slit to become a plane wave. [0003] With the advancement of science and technology, the research on the microcosm continues to deepen, and the processing of various precision instruments needs to be tested and monitored. There are protrusions or cracks in the tiny parts in precision instruments. Due to the extremely small size of the tiny...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02G06T7/00G06T7/90
Inventor 赵胜达孙正杨郭欣然
Owner BEIJING JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products