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Alpha, beta and gamma surface pollution instrument detector based on MPPC array and assembling method thereof

A surface contamination and instrument detector technology, which is used in instruments, measuring devices, scientific instruments, etc., can solve the problems of pollution, small size, and poor detection surface position, and achieve the effects of small size, poor position response, and low voltage.

Pending Publication Date: 2019-08-02
SHANGHAI ERGONOMICS DETECTING INSTR
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Problems solved by technology

[0004] In order to solve the problems existing in the prior art, the object of the present invention is to provide a kind of small in volume, can solve the problem of corresponding difference of the position of detection surface based on MPPC array α, β and γ surface pollution meter detector

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  • Alpha, beta and gamma surface pollution instrument detector based on MPPC array and assembling method thereof
  • Alpha, beta and gamma surface pollution instrument detector based on MPPC array and assembling method thereof

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Embodiment Construction

[0024] Exemplary embodiments are described in detail herein, the examples being in the accompanying drawings, and where the following description refers to the accompanying drawings, like numerals in different drawings refer to the same or similar elements unless otherwise indicated.

[0025] In order to solve the problem of large volume and poor consistency of the position response of the detection surface in the existing surface pollution meter, the present invention provides a detector of α, β and γ surface pollution meter based on MPPC array, which includes:

[0026] Double scintillation detector, which detects the photons produced by the particle;

[0027] Reflecting bowl 1, used to reflect the photons detected by the double scintillation detector;

[0028] A silicon photomultiplier to receive photons reflected by the reflective bowl and convert the light signal into a charge signal;

[0029] Signal processing circuitry for activity measurement of the charge signal forme...

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Abstract

The invention discloses an alpha, beta and gamma surface pollution instrument detector based on an MPPC array and an assembling method thereof. The detector comprises a double-flash detector used fordetecting photons generated by particles, a reflection bowl (1) used for reflecting the photons detected by the double-flash detector, a silicon photomultiplier used for receiving the photons reflected by the reflection bowl and converting an optical signal into an electric charge signal, and a signal processing circuit used for carrying out activity measurement on the electric charge signal formed by the silicon photomultiplier. By using the detector, the silicon photomultiplier is used to realize conversion between the optical signal and the electric charge signal, the silicon photomultiplier has a low voltage and a small size and can be used in an array mode, and a problem that position response of a detection surface is poor is solved.

Description

technical field [0001] The invention relates to an MPPC array-based α, β and γ surface pollution meter detector and an assembly method thereof. Background technique [0002] The current surface pollution meter generally uses double flash detectors as α, β and γ detectors, converts photons into electrons through photomultiplier tubes (PMT) as photoelectric conversion devices, and then cooperates with operational amplifiers and comparators to output nuclear pulses, thereby Complete the entire measurement process. [0003] The existing α, β and γ surface contamination meters use PMTs as photoelectric conversion devices, which are bulky, require hundreds or even thousands of volts of high voltage to work, and have poor positional response consistency of the detection surface. Contents of the invention [0004] In order to solve the existing problems in the prior art, the object of the present invention is to provide a MPPC array-based α, β, and γ surface contamination meter d...

Claims

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Application Information

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IPC IPC(8): G01T1/167G01T1/20
CPCG01T1/167G01T1/20
Inventor 张志勇刘思平李晨
Owner SHANGHAI ERGONOMICS DETECTING INSTR
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