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Micro-nano satellite multi-assembly thermal vacuum batched test device and test method

A technology of a micro-nano satellite and a test device, which is applied to the test of the device, the field of the multi-component thermal vacuum batch test device of the micro-nano satellite, can solve the problems of difference, time and economic unbearableness, and achieves reducing the test cost and improving the test. The effect of efficiency

Active Publication Date: 2019-08-09
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the method of using traditional satellites to test similar components separately, it will be unbearable in terms of time and economy for the thermal vacuum test of micro-nano satellite components
However, if different temperature control requirements and different types of micro-nano-satellite components are tested in the same group, it will also face the problem of how to solve the problem of differential control and personalized thermal characteristics

Method used

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  • Micro-nano satellite multi-assembly thermal vacuum batched test device and test method
  • Micro-nano satellite multi-assembly thermal vacuum batched test device and test method

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Embodiment approach 1

[0028] Reference attached figure 1 , figure 1 It is a schematic diagram of the micro-nano-satellite multi-component thermal vacuum batch test device of the present invention; wherein, the micro-nano-satellite multi-component thermal vacuum batch test device includes a guide rail 1, three heating units 2, and two heat shields 3; the whole device is in Inside the long cylindrical vacuum tank heat sink 4, the guide rail 1 is fixed on the bottom of the vacuum tank heat sink 4, the heating unit 2 and the heat shield 3 are fixed on the guide rail 1, and the three heating units 2 are insulated by two The plates 3 are separated so that direct heat radiation cannot be performed between different heating units 2; the heating unit 2 includes an infrared cage 21, a bracket 22, and a mounting plate 23, wherein the bottoms of the infrared cage 21 and the bracket 22 are respectively fixed on the guide rail 1, The mounting plate 23 is fixed on the top of the bracket 22, and the mounting plat...

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Abstract

The invention discloses a micro-nano satellite multi-assembly thermal vacuum batched test device. The micro-nano satellite multi-assembly thermal vacuum batched test device comprises guide rails, a heating unit and a heat insulating plate in vacuum tank heat sink; the heating unit comprises an infrared cage, a support and a mounting plate; and the micro-nano satellite multiassemblies to be testedare arranged on the mounting plate, and geometric envelope of the infrared cage completely covers the assemblies to be tested, the support and the mounting plate. The invention further discloses a corresponding test method. According to the micro-nano satellite multi-assembly thermal vacuum batched test device and the test method, the test efficiency can be significantly improved, and the test cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of spacecraft environmental testing. Specifically, the invention relates to a micro-nano-satellite multi-component thermal vacuum batch test device. At the same time, the invention also relates to a test method corresponding to the device. Background technique [0002] Micro-nano satellites refer to satellites with an overall star mass of 100 kg or less, adopting an open architecture and standard interface specifications, and extensively applying innovative design concepts and technologies such as COTS device components, industrial technology, and miniaturized products. Micro-nano satellites are a new generation of satellites that have developed rapidly in recent years and have clear uses. They are also one of the important directions for the development of spacecraft technology. Good technical, economic and social benefits. [0003] Like traditional satellites, micro-nano satellites will also face the test...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B64G1/10B64G1/22G01K13/00
CPCB64G1/10B64G1/22G01K13/00
Inventor 杨勇黄首清郭佳诚杨晓宁刘守文李芳勇陈安然李文淼刘旭升张立海姚泽民王雪薇
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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