Testing structure and method for back drill alignment degree of 5G circuit board
A technology of test structure and test method, which is applied in the field of PCB board manufacturing, can solve problems such as difficulties, missed inspection of boards, and long time consumption, and achieve the effect of large amount of detection, fast speed, and improved detection efficiency
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[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0029] In the present embodiment, the number of layers n of the core board 1 of the PCB board is 10, the quantity w of the test unit 11 is 3, and the quantity j of the small group 111 of each test unit 11 in the 3 test units 11 is all 4, need The number of layers m of the back drilled core board 1 is 4, that is, the back drill 1112 on the first to fourth layers of the core board 1 on the PCB needs to be drilled off, the width d1 of the ring line 1113 on the first layer is 4mil, and a is 1mil , the back-drilling alignment is set to 4mil, what needs to be explained here is the width of the ring line ...
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