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Photoelectric sensor intelligent test system used in space

A photoelectric sensor and test system technology, applied in the direction of instruments, measuring devices, etc., can solve the problems of high cost, complex test equipment construction, etc., and achieve the effect of improving efficiency

Inactive Publication Date: 2019-09-20
SHANGHAI AEROSPACE CONTROL TECH INST
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides an intelligent test system for photoelectric sensors for space, which solves the problem of complex and high cost of test equipment due to the need to assemble multiple boards in the traditional industrial computer

Method used

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  • Photoelectric sensor intelligent test system used in space
  • Photoelectric sensor intelligent test system used in space
  • Photoelectric sensor intelligent test system used in space

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Experimental program
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Embodiment Construction

[0035] The present invention will be further described below in conjunction with accompanying drawing:

[0036] Please refer to figure 1 , which is a structural schematic diagram of a photoelectric sensor intelligent test system for space provided by the present invention, including a storage module 1, a functional board module 2, a photoelectric sensor 3 and a photoelectric sensor assembly 4, and the functional board module 2 and The CPU information processing storage module 1 is electrically connected to the photoelectric sensor 3 ; the photoelectric sensor component 4 is arranged inside the photoelectric sensor 3 .

[0037] Please refer to figure 2 , is a structural schematic diagram of the functional board module 2 in the present invention, including an Ethernet transmission interface 21, an external power supply interface 22, an RS422 serial port 23, a 1533B address configuration serial port 24, a 1533B communication serial port 25, and an independent test interface 26 ...

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Abstract

The invention discloses a photoelectric sensor intelligent test system used in a space. The system comprises a CPU information processing storage module, a function board card module, a photoelectric sensor and a photoelectric sensor component. Through arranging the CPU information processing storage module and the function board card module, interfaces of 422 serial port, a second pulse, LVDS communication, 1553B communication, Cameralink communication and the like are integrated, and a problem that a traditional industrial personal computer needs to assemble multiple board cards so that test equipment is built complexly and cost is high is solved. Through arranging the function board card module and the photoelectric sensor, according to test requirements, a test excitation file only needs to be input, a product test can be automatically completed, and a test result is output. A pre-arranged plan is set for a possible fault of a product and the product is protected from being damaged. A fully autonomous and intelligent test of a photoelectric sensor environmental test is used to automatically record an abnormal phenomenon during a product test process.

Description

technical field [0001] The invention relates to the technical field of intelligent testing, in particular to an intelligent testing system for space photoelectric sensors. Background technique [0002] A photoelectric sensor is a sensor that uses a photoelectric element as a detection element. It first converts the measured changes into changes in optical signals, and then further converts the optical signals into electrical signals with the help of photoelectric elements. The photoelectric sensor is generally composed of three parts: light source, optical path and photoelectric element. By inputting the test stimulus file, the photoelectric sensor is used to test the product, output the test result, and perform remote access. However, the existing technology needs to assemble multiple boards when using an industrial computer. The card makes the test equipment complex to build, the serial port of the application is incomplete, and the cost is high. The test system may damag...

Claims

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Application Information

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IPC IPC(8): G01C25/00
CPCG01C25/00
Inventor 郑循江闫晓军周琦马英超范勇张磊赵旸
Owner SHANGHAI AEROSPACE CONTROL TECH INST
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