Full-automatic test system for MCU chip
A fully automatic testing and chip technology, applied in the direction of using power-on testing to detect faulty hardware, error detection/correction, and detection of faulty computer hardware, etc. and time, improve work efficiency
Active Publication Date: 2019-09-24
上海琪埔维半导体有限公司
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Problems solved by technology
[0003] At present, the closest existing technology, testing MCU chips requires the preparation of multiple hardware test environments and multiple sets of software versions, and at the same time requires manual participation in the entire testing process, so it is a complex and time-consuming task that consumes a lot of manpower and time. To complete a lot of repetitive testing work
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[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0043] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.
[0044] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.
[0045] The present invention includes a kind of test system for MCU chip, including:
[0046] a computer 1;
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The invention relates to the technical field of integrated circuits, in particular to a full-automatic test system for an MCU chip, and the system comprises a computer; an external supply direct-current power supply, used for providing power supply voltage for the test main board; a test mainboard, respectively connected with the computer and the external DC power supply. The test mainboard comprises a main control chip, the main control chip being used for controlling the automatic execution of the test system; a tested MCU chip, used for receiving the scheduling of the main control chip and executing a plurality of test items of the test system in a matching manner; and a plurality of execution test units, respectively connected between the main control chip and the tested MCU chip and used for respectively testing a plurality of test items and storing corresponding test data into the computer by the main control chip. The system has the advantage that by adopting the combination mode of hardware design and software control, software automatically executes to complete all tests after the test is started, manual participation is not needed in the test process, manpower and time are saved, and the working efficiency is improved.
Description
technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a fully automatic testing system for MCU chips. Background technique [0002] MCU (Microcontroller Unit, microcontroller unit), also known as single-chip microcomputer or single-chip microcomputer, is an integrated CPU (Central Processing Unit, central processing unit), Memory (memory), SPI (SerialPeripheral Interface, serial peripheral interface ), I2C (Inter-Integrated Circuit, internal integrated circuit serial communication), UART (Universal Asynchronous Receiver / Transmitter, Universal Asynchronous Receiver Transmitter), GPIO (General-purpose input / output, general-purpose input and output interface), CAN (Controller AreaNetwork, controller area network), LIN (Local Area Network, local intranet), ADC (Analog-to-digital converter, analog-to-digital converter) and other functions of the digital-analog hybrid chip. [0003] At present, the closest existing technology...
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IPC IPC(8): G06F11/22G06F11/273
CPCG06F11/2236G06F11/2284G06F11/273Y02P90/02
Inventor 邓建秦岭
Owner 上海琪埔维半导体有限公司