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Infrared reflection and transmission measurement system and method

A measurement system and infrared reflection technology, applied in the field of spectral measurement, can solve the problems of inability to couple measurement of low temperature and superconducting magnets, and inability to simultaneously perform reflection and transmission spectroscopy, measurement, etc.

Active Publication Date: 2022-07-15
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the usual reflection spectrum measurement accessories or transmission spectrum measurement methods configured by infrared spectrometers cannot be coupled with cryogenic and superconducting magnets for measurement at the same time
Even if it is not measured under low temperature or magnetic field, it is impossible to measure the reflection and transmission spectra at the same time. When measuring the reflection spectrum, the corresponding reflection accessory must be installed on the spectrometer for measurement. When measuring the transmission spectrum, the reflection accessory must be removed for measurement, and the sample needs to be reloaded.

Method used

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  • Infrared reflection and transmission measurement system and method
  • Infrared reflection and transmission measurement system and method
  • Infrared reflection and transmission measurement system and method

Examples

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experiment example 1

[0068] In this experimental example, by measuring SrTiO 3Single crystal sample reflectance spectrum, illustrating an embodiment of reflectance spectrum measurement. First, the magnet excitation work is done in advance according to the requirements of the superconducting magnet 22 until the magnet meets the working state. Take out the low temperature sample rod 24 from the temperature hole where it is located, and place the SrTiO with a size of 5mm×5mm×0.5mm. 3 The single crystal sample and the reference gold-coated mirror are mounted on two sample positions of the reflective sample holder at the front of the sample holder 24, respectively. Insert the sample rod 24 into the room temperature hole, and adjust the position of the reference gold mirror to the center of the optical path. Depending on the wavelength band to be measured, by changing the optical mirror M5, the light is selected to be transmitted to different reflection detectors. Using the spectrometer to monitor th...

experiment example 2

[0070] This example is done by measuring ZnO / HfO 2 Transmission spectrum of the / Si thin film sample, illustrating an embodiment of the transmission spectrum measurement. First, do the magnet excitation work in advance according to the requirements of the superconducting magnet until the magnet meets the working state. Take the cryogenic sample holder 24 out of the room temperature hole, install the transmission sample holder, place the ZnO / HfO2 / Si thin film sample on one of the sample positions of the transmission sample holder (the sample is placed in the center of the hole), while keeping the other sample position free. Place the sample. Insert the sample rod 24 into the room temperature hole, and adjust the center of the hole where the sample is not placed to the center of the optical path. Depending on the wavelength band to be measured, the light transmission to different transmission detectors is selected by changing the optical mirror M10. The spectrometer is used t...

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Abstract

The invention discloses an infrared reflection and transmission measurement system and method. The technical scheme of the invention aims at the characterization of the physical properties of magnetic field regulation, and combines infrared spectroscopy measurement and magnetic field to realize variable low-temperature infrared reflection and transmission measurement under the magnetic field. , and the measurement system does not need to change the optical path or reload the sample when performing reflection and transmission measurements. For a sample that can reflect and transmit infrared light, its reflection and transmission spectra can be measured at the same time.

Description

technical field [0001] The invention relates to the technical field of spectrum measurement, and more particularly, to an infrared reflection and transmission measurement system and method. Background technique [0002] Infrared spectroscopy is a powerful method to study the optical properties of materials, molecular vibrations, and the dynamic behavior of low-energy charges in quantum functional materials. It has a wide range of applications in materials science, physics, chemistry, polymer science, biology and life sciences. By measuring the infrared reflection spectrum or transmission spectrum of the sample, its optical coefficient (dielectric coefficient, photoconductivity, refractive index, etc.), molecular structure, and various fundamental excitations (electrons, phonons, spins, plasmons, etc.) can be obtained. etc.) and the interactions between them. [0003] Magnetic fields can couple electronic charges to the protons, neutrons and electron magnetic moments that ma...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/35G01N21/31G01N21/3563G01N21/552G01N21/01
CPCG01N21/35G01N21/31G01N21/3563G01N21/55G01N21/01G01N2021/3196G01N2021/3595G01N2021/558G01N2021/0112
Inventor 戚泽明胡传圣李承祥
Owner UNIV OF SCI & TECH OF CHINA