Unmanned aerial vehicle inspection power transmission line pin defect grading image recognition method
A power transmission line and image recognition technology, which is applied in the field of image recognition, can solve problems such as the difficulty in detecting whether a screw is missing or missing a pin, and achieve the effect of simplifying the workload and improving the detection rate
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Embodiment 1
[0029] This embodiment implements a method for grading image recognition of pin defects in a UAV patrolling transmission lines.
[0030] Convolutional Neural Networks (CNN) is a type of feed-forward neural network that includes convolution calculations and has a deep structure. It is one of the representative algorithms for deep learning.
[0031] Support vector machine (Support Vector Machine, SVM) is a kind of generalized linear classifier for binary classification of data according to supervised learning.
[0032] SIFT, or Scale-invariant feature transform (SIFT), is a description used in the field of image processing. This description is scale-invariant and can detect key points in the image. It is a local feature descriptor.
[0033] K-means clustering algorithm (k-means clustering algorithm) is a clustering analysis algorithm for iterative solution. Its steps are to randomly select K objects as initial cluster centers, and then calculate the relationship between each ob...
Embodiment 2
[0059] This embodiment implements a method for grading image recognition of pin defects in a UAV patrolling transmission lines.
[0060] attached figure 2 The flow chart of an embodiment of the method for grading image recognition of pin defects in a UAV patrolling transmission lines. This embodiment is improved on the basis of Embodiment 1, or it is actually applied on the ground.
[0061] The system implementing this embodiment includes a camera, a region recommendation convolutional neural network, extracting SIFT features, making a bag-of-words model, and SVM classification.
[0062] Camera devices include drones, mobile phones, cameras, etc.
[0063] All pins are located by the trained area recommendation convolutional neural network, the pin image is up-sampled and grayscaled to extract SIFT features, and the K-means algorithm is used to make a bag-of-words model, which is sent to the SVM classifier to determine whether the pin is defective .
[0064] The region reco...
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