Measuring device for measuring refractive index of optical material based on quantum Zeno effect

Abstract

The invention, which belongs to the technical field of quantum precision measurement, discloses a measuring device for measuring the refractive index of an optical material based on the quantum Zeno effect. The measuring device comprises a base film Gaussian beam, a high-order Laguerre Gaussian beam, an unequal-arm MZ interferometer, and a high-resolution CCD imaging system. The base film Gaussianbeam and the high-order Laguerre Gaussian beam have a locked frequency difference. The unequal-arm MZ interferometer includes a first beam splitter, an upper arm structure, a lower arm structure, anda second beam splitter; the base film Gaussian beam and the high-order Laguerre Gaussian beam enter from the same side of the first beam splitter, pass through the upper arm structure and the lower arm structure respectively, and then enter the second beam splitter from the two sides respectively. The high-resolution CCD imaging system is arranged at the same side of the lower arm structure. Themeasuring device has a simple and compact structure and accurate measurement is realized under the lossless condition.

Description

technical field [0001] The invention belongs to the technical field of quantum precision measurement, and in particular relates to a lossless and precise measurement device for the refractive index of optical materials based on the quantum Zeno effect. Background technique [0002] With the demand and development of science and technology, the precise measurement methods of physical quantities are also diversified, which are widely used in the research of refractive index detection of various optical materials (such as crystals, polymers, biological tissues, etc.). In the quantum precision measurement system, the light field is used as the transmission source, combined with the quantum effect and precision measurement technology to detect the amplitude, phase, noise and other physical quantities of the light field, and realize the measurement of the relevant parameters of the measured, which deeply promotes the physics and application. Interdisciplinary development. [0003...

AI Technical Summary

Problems solved by technology

However, there are still many defects in practical applications, such as the introduction of noise in the measurement channel, the dissipation of the optical path, and the loss of optical components, which will reduce the no-interaction efficiency of the detection system.

Therefore, it is impossible to accurately measure and manipulate the refractive index of optical materials under efficient non-interaction conditions using traditional non-interaction measuring devices.

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