Vision-based LED chip quality detection method

Abstract

The LED chip quality detection method based on vision comprises the following steps: detecting the quality of an LED chip based on vision; the industrial camera acquires an image of the LED chip; adaptive thresholding processing is carried out on the image; extracting edge contour points of the LED chip image based on a connected domain; screening the edge contour points and fitting an ellipse through a least square method; inverse scale transformation is carried out on the ellipse to obtain an amplified LED ellipse contour image; intercepting a region of interest image, and calculating segmentation thresholds under different conditions, performing expansion processing on the segmented images, performing morphological closing operation on the expanded images to eliminate fine holes, performing connected domain marking on hole areas, setting thresholds to eliminate areas smaller than the thresholds, detecting damaged areas of lamp beads, and displaying outlines of the damaged areas so as to detect the quality of the LED chip. The method has the advantages that the test is accurate, the chip electrode is not damaged in the test process, the labor cost is saved, the false detection rate of the product is reduced, and the production efficiency and the enterprise profit are improved.

Description

technical field [0001] The invention relates to the field of LED chip quality detection, in particular to a vision-based LED chip quality detection method. Background technique [0002] LED is short for Light Emitting Diode, and its basic structure is a piece of electroluminescent semiconductor material. With the development of the industry, the luminous efficiency of leds continues to increase, and the price continues to decline. With its advantages of energy saving, environmental protection, safety, high brightness, long life, waterproof, shockproof, etc., it is widely used in various lighting, display, decoration, etc. field. [0003] The manufacturing process of LED chips can be divided into wafer processing process, wafer needle measurement process, construction process, testing process, etc. During the manufacturing process, due to the imperfect production process, the produced chips will have local poor conductivity and cannot emit light. However, the product qualit...

AI Technical Summary

Problems solved by technology

[0006] In order to solve the shortcomings of the power-on test and manual detection methods and improve the detection accuracy and stability, the present invention provides a vision-based LED chip quality detection method. The LED chip that is emitting light is photographed by an industrial camera with an optical filter. Threshold segmentation technology detects and judges the quality of LED chips

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