System for measuring Mueller matrix spectrum in real time and measuring method thereof

A real-time measurement and matrix technology, applied in the direction of polarization influence characteristics, complex mathematical operations, etc., can solve the problems of increasing system error, crosstalk, long measurement time and inapplicability, and achieve the effect of suppressing channel crosstalk and improving the resolution of the restored spectrum

Active Publication Date: 2019-12-13
XIAN UNIV OF TECH
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Problems solved by technology

At present, only a few scientific research institutions in the world carry out relevant research work
In particular, the instruments for real-time acquisition of Mueller matrix spectra are still in the stage of principle exploration and experimental verification, and their technical means are not yet mature.
[0003] At present, there are mainly two types of conventional Mueller matrix spectral measurement methods in the world: one is carried out in time order, and the compensator of the polarizer arm and the polarizer arm is set at a certain rate ratio 5ω:mω (ω is the base of the coaxial motor. Frequency, m is a non-zero integer and not equal to 5 or 10) Rotation produces different time modulation frequencies, and obtaining all 16 Mueller matrix elements of the sample through Fourier transform demodulation requires detector readings N=4m+21 times to ensure The complete waveform analysis is completed within one optical period T=π/ω, and the time spent is t=N×t 0 (t 0 is the readout time of the de

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  • System for measuring Mueller matrix spectrum in real time and measuring method thereof
  • System for measuring Mueller matrix spectrum in real time and measuring method thereof
  • System for measuring Mueller matrix spectrum in real time and measuring method thereof

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Embodiment Construction

[0052] The present invention will be described in detail below in combination with specific embodiments.

[0053] The present invention measures the system of Mueller matrix spectrum in real time, and it constructs the xyz coordinate system that satisfies the right-hand rule, such as figure 1 As shown, it includes a light source 1, an optical fiber 2, a collimation system 3, a polarizer 4, a first retarder 5, a second retarder 6, a sample stage 7, and a third retarder 8 along the incident direction of the incident light. , Wollaston prism 9, spectrometer group. Taking the direction of the main optical axis of the light as the positive direction of the z-axis, taking the direction of the transmission axis of the polarizer 4 as the positive direction of the x-axis, the angle between the direction of the fast axis of the first retarder 5 and the positive direction of the x-axis is 45°, The angle between the fast axis direction of the second retarder 6 and the positive direction ...

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Abstract

The invention discloses a system for measuring a Mueller matrix spectrum in real time. The system comprises a light source, an optical fiber, a collimation system, a polarizer, a first delayer, a second delayer, a sample table, a third delayer, a Wollaston prism and a spectrograph group which are sequentially arranged in an incident direction of incident light. The invention further discloses a method for measuring the Mueller matrix spectrum in real time. Fourier transform, channel filtering and inverse Fourier transform are carried out on spectral intensity obtained by spectrographs, a Stokes vector S emitted from the surface of a measured sample can be restored, Fourier transform, channel filtering and inverse Fourier transform are carried out on four Stokes parameters in S such that spectrums of 16 Mueller matrix elements can be restored. According to the invention, the channel crosstalk is avoided, the measurement accuracy is high, and the operability is strong.

Description

technical field [0001] The invention belongs to the technical field of polarization spectrum measurement, relates to a system for real-time measurement of Mueller matrix spectrum, and also relates to a method for real-time measurement of Mueller matrix spectrum. Background technique [0002] The Mueller matrix can completely describe the polarization response properties of the object to light. By obtaining the Mueller matrix spectrum of the tested sample, many optical characteristics of the tested sample can be obtained, such as depolarization effect, anisotropy of surface etching and asymmetry of the cross section. . As a new type of optical detection method, Mueller matrix spectral measurement technology has broad application prospects in the fields of integrated circuit manufacturing, flat panel display, and biomedical diagnosis. At present, only a few scientific research institutions in the world carry out relevant research work. In particular, the instruments for real...

Claims

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Application Information

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IPC IPC(8): G01N21/21G06F17/14
CPCG01N21/21G06F17/14
Inventor 权乃承
Owner XIAN UNIV OF TECH
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