Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for multi-point non-uniform correction based on temperature of detector

A non-uniform correction and detector technology, which is applied in the direction of electric radiation detectors, radiation pyrometry, instruments, etc., can solve the problems of infrared image non-uniformity, achieve high accuracy, save production costs, and expand the application range.

Active Publication Date: 2019-12-20
WUHAN HUAZHONG NUMERICAL CONTROL
View PDF5 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a multi-point non-uniformity correction method based on the detector temperature, aiming at solving the problem of non-uniformity of the existing infrared images

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for multi-point non-uniform correction based on temperature of detector
  • Method for multi-point non-uniform correction based on temperature of detector
  • Method for multi-point non-uniform correction based on temperature of detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0050] Such as figure 1 As shown, the embodiment of the present invention provides a method for multi-point non-uniform correction based on detector temperature, including the following steps:

[0051] (1) Collect multiple uniform background images within the working temperature range of the detector, save the background information of each background image, and record the corresponding detector temperature AD value;

[0052] (2) Fit the background under the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for multi-point non-uniform correction based on temperature of a detector, and the method comprises the following steps of collecting a plurality of uniform backgroundimages within the working temperature range of the detector, saving the background information of each background image, and recording the corresponding temperature AD value of the detector; fitting the background of the current temperature of the detector according to the background information of each background image collected and the corresponding temperature AD value of the detector; sequentially stabilizing the detector at a plurality of different temperature points, respectively collecting high temperature background and low temperature background at each temperature point, calculatinggains corresponding to different temperature points of the detector, saving the gain data, and saving the corresponding temperature AD value of the detector; fitting the gain corresponding to the current temperature of the detector by using the gains corresponding to the different temperature points of the detector; and correcting the infrared image by using the background at the current temperature of the detector and the gain corresponding to the current temperature of the detector. The method provided by the invention does not need to hit a shutter, saves production cost, and can adaptivelycorrect infrared images.

Description

technical field [0001] The invention relates to the field of infrared image processing, in particular to a multi-point non-uniform correction method based on detector temperature. Background technique [0002] Infrared focal plane array is a new generation of infrared detector with both radiation sensitivity and signal processing functions, and it is the key device of modern infrared imaging system. Due to the influence of materials and manufacturing processes, the responsivity of each detection unit is inconsistent, resulting in the general non-uniformity of the infrared focal plane array, which affects the imaging quality of the infrared detector. [0003] The existing solution to the non-uniformity of the infrared image is to obtain the background data by periodically opening the shutter, and correct the infrared image. Opening the shutter will interrupt the detection process, affect the application of infrared detectors, and increase the cost. In addition, the existing...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10
CPCG01J5/10G01J2005/0077G01J5/80
Inventor 公志强彭玲汪利庆刘仁军何涛覃杰陈煜卓周国栋张文芳岳云芳
Owner WUHAN HUAZHONG NUMERICAL CONTROL
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com