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Measurement device for measuring wave aberration of optical system based on acousto-optic modulator heterodyne interference

An acousto-optic modulator and optical system technology, which is applied in the testing of optical instruments, testing of optical performance, testing of machine/structural components, etc. and other problems, to achieve the effect of low installation and adjustment cost, high installation and adjustment accuracy, and measurement optimization.

Active Publication Date: 2020-02-28
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0006] In order to solve the problems of the existing phase-shift interferometry equipment, such as difficult installation and adjustment, high cost, difficulty in improving the signal-to-noise ratio of the detector signal, and low measurement accuracy, the present invention provides a heterodyne interferometry optical system based on an acousto-optic modulator Measuring equipment for wave aberration

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  • Measurement device for measuring wave aberration of optical system based on acousto-optic modulator heterodyne interference
  • Measurement device for measuring wave aberration of optical system based on acousto-optic modulator heterodyne interference

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Embodiment Construction

[0017] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0018] A measuring device for measuring wave aberration of an optical system based on AOM heterodyne interferometry, including a first laser 15, a fiber beam splitter 16, a first fiber AOM 17, a second fiber AOM 18, a first Fiber collimator 19, second fiber collimator 20, first beam splitter 23, first beam combiner 25, point detector 26, first polarization adjustment system, second beam combiner 31, second beam splitter device 32, a second polarization adjustment system, and a first area array detector 37. The first polarization adjustment system includes a first polarization beam splitter 27, a first quarter-wave plate 28, and a first mirror 30 arranged in sequence, and the optical system 29 to be measured is arranged in the first polarization adjustment system, specifically The optical system 29 to be tested is located between the first qua...

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Abstract

The invention discloses a measurement device for measuring wave aberration of an optical system based on acousto-optic modulator heterodyne interference, and relates to the technical field of opticalinspection and measurement. The problems that existing adjustment is difficult, high in cost and low in measurement precision are solved. The device comprises a first laser, an optical fiber beam splitter, a first optical fiber acousto-optic modulator, a second optical fiber acousto-optic modulator, a first optical fiber collimator, a second optical fiber collimator, a first beam splitter, a firstbeam combiner, a point detector, a first polarization adjustment system, a second beam combiner, a second beam splitter, a second polarization adjustment system and a first area array detector, wherein an optical system to be measured is arranged in the first polarization adjustment system. According to the measurement device, by means of the optical fiber beam splitter, the first optical fiber acousto-optic modulator and the second optical fiber acousto-optic modulator, the adjustment cost is low, the adjustment precision is high, the problem that the fundamental frequency of a single acousto-optic modulator is too high is solved, measurement errors introduced by the single acousto-optic modulator are overcome, and the measurement precision is improved.

Description

technical field [0001] The invention relates to the technical field of optical inspection and measurement, in particular to a measurement device for measuring the wave aberration of an optical system based on an acousto-optic modulator heterodyne interferometry. Background technique [0002] The cutting-edge technology of space detection represented by space gravitational wave detection poses a great challenge to the accuracy requirements of long-baseline laser interferometry ranging. The optical system represented by the telescope is an important part of the long-baseline laser interferometric ranging system, and its system wave aberration is an important factor affecting the accuracy of interferometric ranging. [0003] At present, the wave aberration detection method of high-precision telescope system usually adopts phase shift interferometry, and the commonly used phase shift method is to push the mechanical phase shift of the reference mirror through the mechanical stru...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0271
Inventor 方超沙巍王智李钰鹏于涛
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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