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Optical devices, optical ic chips, wafers and optical transceiver modules

A technology of optical devices and chips, applied in electromagnetic transceivers, optical components, optical waveguides and light guides, etc., can solve the problems of optical devices taking a long time

Active Publication Date: 2021-10-29
FUJITSU OPTICAL COMPONENTS LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For this reason, the testing of optical devices takes a long time

Method used

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  • Optical devices, optical ic chips, wafers and optical transceiver modules
  • Optical devices, optical ic chips, wafers and optical transceiver modules
  • Optical devices, optical ic chips, wafers and optical transceiver modules

Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0027] Figure 5 An example of the optical IC chip according to the first embodiment is shown. In this embodiment, if Figure 5 As shown, the optical IC chip 100 includes a device region, a GC region and a foldback region. In the device region, an optical device circuit is formed. In this embodiment, the optical device circuit includes an optical receiver 10 and an optical modulator 20 . In the GC region, one or more grating couplers are formed. In this embodiment, the grating coupler 31 to the grating coupler 33 are formed in the GC region. In the folded-back region, some parts of the optical waveguide that couple the optical device circuit with the grating coupler 31 to the grating coupler 33 are formed.

[0028] In the embodiments described below, the optical device circuit formed on the optical IC chip includes the optical receiver 10 and the optical modulator 20, but the embodiment is not limited to this configuration. In other words, such a configuration that the o...

no. 2 approach

[0047] according to Figure 5 In the configuration shown in , in each optical IC chip, in addition to a device region for forming an optical device circuit, a GC region for forming a grating coupler and a foldback region for forming an optical waveguide are required. In this case, a smaller number of photo IC chips can be formed on one wafer. The second embodiment solves or alleviates this problem.

[0048] Figure 8 An example of the optical IC chip according to the second embodiment is shown. In this embodiment, the optical IC chip 100 has a rectangular shape. The shape of the optical IC chip 100 may be a parallelogram. Note that each grating coupler is in Figure 8 Indicated by "G".

[0049] exist Figure 8 , four optical IC chips 100a to 100d among a plurality of optical IC chips 100 formed on a wafer are shown, and these four optical IC chips are arranged adjacent to each other in the region of the upper left corner of the wafer. Note that the folded-back regions ...

no. 3 approach

[0058] exist Figure 8In the configuration shown in , a grating coupler for testing an optical device in an optical IC chip is formed in another optical IC chip. In the third embodiment, a grating coupler for testing optical devices in an optical IC chip is formed in the same chip.

[0059] Figure 9 An example of the optical IC chip according to the third embodiment is shown. In the third embodiment, the optical IC chip 100 may also have a rectangular shape or may be a parallelogram.

[0060] exist Figure 9 In , two optical IC chips 100 a and 100 b among a large number of optical IC chips 100 formed on a wafer are shown. The optical IC chip 100a is arranged on the uppermost side of the optical IC chip on the wafer. The optical IC chip 100b is arranged adjacent to the lower side of the optical IC chip 100a. Note that the turn-back region is formed adjacent to the upper side of the optical IC chip 100 arranged at the uppermost side of the optical IC chip on the wafer.

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Abstract

Optical devices, optical IC chips, wafers and optical transceiver modules. Optical devices are formed on optical IC chips. The shape of the optical IC chip is a rectangle or a parallelogram. The optical device includes: an optical device circuit; a first optical waveguide coupled to the optical device circuit; a pad electrically connected to the optical device circuit; a grating coupler; Two optical waveguides, the second optical waveguide coupled to the grating coupler. The bonding pad is formed in a region of the optical IC chip close to the first side, and the grating coupler is formed in a specific region on the optical IC chip not close to the first side. The first optical waveguide and the second optical waveguide respectively extend to the edge of the optical IC chip.

Description

technical field [0001] Embodiments discussed herein relate to optical devices and optical transceiver modules. Background technique [0002] figure 1 An example of an optical device is shown. The optical device in this example includes an optical receiver 10 and an optical modulator 20 . The optical device is provided with continuous wave light LD_in generated by a light source (not shown). [0003] The optical receiver 10 includes a variable optical attenuator (VOA), a monitoring photodetector (mPD), a polarization beam splitter (PBS), a polarization rotator (PR), a 90-degree optical hybrid circuit, and a photodetector (PD XI, PD XQ, PD YI, PD YQ). The optical receiver 10 generates the electric field information signal RF_out representing the received optical signal Rx_in by means of coherent detection using the continuous wave light LD_in. Note that the amount of attenuation in the VOA is controlled by the power control signal provided via pad 1 . A monitor signal in...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B6/12G02B6/26
CPCG02B6/12G02B6/12004G02B6/26G02B2006/12107G02B6/30G02B6/34G02B6/4249H04B10/40H04B10/564H04B10/50597G01R31/318511G02B27/283G01R31/282
Inventor 杉山昌树
Owner FUJITSU OPTICAL COMPONENTS LTD