Fault management system for functional safety of automotive-grade chips

Abstract

The present invention provides a fault management system oriented to the functional safety of a vehicle-level chip, including: a chip external system (out of chip) and a vehicle-level chip, and the vehicle-level chip includes: a processor (CPU), a system controller (System Controller), system configuration module (System Configure), fault manager (Fault Management), on-chip function module (IP 1 ...IP n ); the fault manager (Fault Management) is configured with a fault classification management model. The system fault management system oriented to the safety of vehicle-level chip functions provided by the present invention can ensure that the system software accurately locates and responds to various faults through a fine-grained fault classification system, and can effectively and timely take reasonable fault response measures to improve system performance. Availability in the event of a failure.

Description

technical field [0001] The invention relates to a passenger car system fault management system, in particular to a system fault management system oriented to the functional safety of a car-level chip. Background technique [0002] Functional Safety (Functional Safety) is crucial to safety-related electrical and electronic systems (such as power control systems) in the automotive field. These functional safety (Functional Safety) applications can impose strict constraints on the system to perform safely and reliably in complex system environments. At present, the design of automotive functional safety (Functional Safety) generally follows the ISO (International Organization for Standardization) 26262 standard (for automobiles, released for the first time in 2011 and released the second edition in 2018), which is based on the functions of electronics, electrical and programmable devices. Derived from the basic safety standard IEC (International Electrotechnical Commission) 61...

AI Technical Summary

Problems solved by technology

[0006] 1. In the absence of a centralized fault management module inside the chip, it brings a lot of load to the fault identification, classification and processing of the system software, which is not conducive to the realization of fast, high coverage and personalized configuration of the chip Power-on (Power-on), power-down (Power-down) self-test;

[0007] 2. In the situation where the fault management module is integrated inside the chip and the faults are classified, but the classification granularity is very large (current faults are divided into two categories: fatal (Fatal) and error (Error)), resulting in the system not being able to effectively and timely Reasonable failure response measures are taken, which reduces the availability of the system in the event of a failure

Images