Device for testing LETID of photovoltaic module and detection method

Abstract

The invention discloses a device for testing LETID of a photovoltaic module and a detection method. The invention relates to the field of photovoltaic module testers. The device comprises an environment box, a movable structure, a temperature adjusting structure and a movable contact testing structure; the movable structure is arranged on the side edge of the environment box; and the temperature adjusting structure is arranged on one side of the outer wall of the environment box. The movable contact test structure is arranged in the environment box. Through arrangement of the movable structure, when the photovoltaic panel is put into the environment box, the photovoltaic panel can stably enter the environment box; through arrangement of the temperature adjusting structure, power adjustmentof the electric heating tube can be achieved by changing the position of the sliding electrode on the resistance coil according to requirements, and adjustment of a test environment is facilitated; and through arrangement of the movable contact testing structure, the sliding conductive plates can be placed on different fixed conductive plates, continuous detection on current is performed throughthe current detector, and testing is achieved.

Description

technical field [0001] The invention relates to the field of photovoltaic module testing, in particular to a device and a detection method for testing a photovoltaic module LETID. Background technique [0002] Light and high temperature induced P-type crystal degradation (LETID) effect on PERC cells will lead to field power loss, affecting polysilicon and single crystal technology; [0003] The standard high temperature "ignition" of PERC technology solar cells can cause hydrogen to diffuse to bulk wafers, combined with bulk defects / impurities, which can lead to LET ID, but it is difficult to exclude defects / impurities from these wafers without a significant increase in cost. Therefore, after testing the photovoltaic panels, it is necessary to design a device and detection method for testing the photovoltaic module LETID. Contents of the invention [0004] The object of the present invention is to provide a device and detection method for testing photovoltaic module LETID...

AI Technical Summary

Problems solved by technology

[0002] Light and high temperature induced P-type crystal degradation (LETID) effect on PERC cells will cause on-site power loss, affecting polysilicon and single crystal technology;

[0003] The standard high temperature "ignition" of PERC technology solar cells can cause hydrogen to diffuse to bulk wafers, combined with bulk defects / impurities, which can lead to LET ID, but it is difficult to exclude defects / impurities from these wafers without a significant increase in cost. Therefore, after testing the photovoltaic panels, it is necessary to design a device and detection method for testing the LETID of photovoltaic modules.

Images