Single microwave quantum inspection device based on second-order coherence measurement

A technology for testing devices and coherence, applied to measuring devices, measuring electrical variables, electromagnetic field characteristics, etc., can solve the problems of expensive maintenance costs and difficult experiments, and achieve the effect of good practicability and simple methods

Active Publication Date: 2020-06-02
CHINA ELECTRONICS TECH GRP NO 39 RES INST +1
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Problems solved by technology

The construction and maintenance of a 10mK-level ultra-low temperature environment is expensive, generally requiring millions of RMB, power c...

Method used

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  • Single microwave quantum inspection device based on second-order coherence measurement
  • Single microwave quantum inspection device based on second-order coherence measurement
  • Single microwave quantum inspection device based on second-order coherence measurement

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Embodiment 2

[0069] Such as image 3As shown, the microwave quantum second-order coherence experimental device works at room temperature, and the working band is the Ku band. Using the Ku-band microwave quantum source, the signal is input to the single microwave quantum amplifier in the form of a single microwave quantum or several single microwave quantum forms. In the converter, the microwave power divider divides the input signal into two, and enters the left and right channels respectively. The microwave signal entering the left channel enters the microwave / optical up-converter device to modulate the laser signal output by the laser. In addition to the original laser carrier frequency, multiple side frequencies appear on the spectrum. The optical extremely narrowband filter only retains a sideband signal, filters out all carrier, sideband and out-of-band spurious signals, and only retains the optical sideband signal with the same characteristics as the input microwave signal. The rig...

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Abstract

The invention provides a single microwave quantum inspection device based on second-order coherence measurement. A microwave quantum source, a single microwave quantum amplifier and a microwave powerdivider are adopted, and then the second-order coherence of the microwave quantum is measured through two microwave/optical up-conversion devices, an optical filtering device, a delay device, a single-photon detector and a quantum processor for simultaneously carrying out quantum processing on two paths of signals, so that the inspection of the characteristics of the single-microwave quantum detector and the inspection of the characteristics of a microwave quantum source can be realized. According to the present invention, the microwave power division is directly carried out behind a microwavesingle quantum source, and the microwave optical up-conversion, optical filtering and other processing are carried out in two paths. All electrical and optical devices and equipment used in the method can work at room temperature, and the single microwave quantum inspection device is of great significance to the microwave quantum metering and the free space microwave quantum detection research.

Description

technical field [0001] The invention belongs to the field of microwave quantum technology, in particular to a single microwave quantum inspection device based on second-order coherence measurement. Background technique [0002] At present, the detection and inspection of microwave quantum is the frontier in the field of quantum precision measurement. The traditional method is to use the macroscopic phenomenon produced by the interaction between microwave and matter (macroscopic object or microscopic particle), such as microwave thermal effect, microwave propagation, scattering, diffraction and interference, etc. to detect. Since its main theoretical basis is Maxwell's equations and does not consider microscopic quantum effects, the detection efficiency and detection accuracy are not high, and it is difficult to reach the single microwave quantum level. [0003] The quantum properties of microwave signals, especially the second-order coherence, are important parameters to ch...

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Application Information

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IPC IPC(8): G01R29/08G01J11/00
CPCG01R29/0814G01J11/00
Inventor 吴养曹陆军尤立星赵卫岗李桂红赵军民张雪松严会玲栾添章利球李浩蒋燕阳李宏科郭明
Owner CHINA ELECTRONICS TECH GRP NO 39 RES INST
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