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X-ray time evolution process measuring device

A technology of time evolution and process measurement, which is applied in the field of quantitative measurement of X-ray radiation flow, can solve the problems of insufficient time resolution and unsatisfactory measurement, and achieve the effect of high time resolution measurement

Pending Publication Date: 2020-06-02
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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  • Abstract
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  • Application Information

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Problems solved by technology

Although this technology and device can realize quantitative measurement in the measurement of X-ray time evolution and meet the research needs, there are still the following shortcomings: the time resolution is not high enough to meet the measurement of the X-ray time evolution process of faster signals

Method used

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  • X-ray time evolution process measuring device
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  • X-ray time evolution process measuring device

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no. 1 example

[0048] Please refer to figure 1 - image 3 As shown, this embodiment provides an X-ray time evolution process measurement device, including: a pulse stretching system and a signal processing system, wherein:

[0049] The pulse stretching system includes an acceleration zone 110, a drift zone 120 and a collection zone 130. The acceleration zone 110 is used to accelerate electrons, and makes the speeds of electrons entering the acceleration zone 110 different in different time periods. The drift zone 120 is used to make the electrons move at a uniform speed. , the collection area 130 is used to collect electrons.

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Abstract

The invention discloses an X-ray time evolution process measuring device, and relates to the field of X-ray radiation flow quantitative measurement. The X-ray time evolution process measuring device comprises an X-ray time evolution process measuring device and an X-ray time evolution process measuring device, wherein the pulse broadening system comprises an acceleration region, a drift region anda collection region, the acceleration region is used for accelerating electrons and enabling the speeds of the electrons entering the acceleration region at different time periods to be different, the drift region is used for enabling the electrons to move at a constant speed, and the collection region is used for collecting the electrons; and the signal processing system is connected with the collection area and is used for obtaining a signal measurement result through broadening and back-stepping calculation. The X-ray time evolution process measuring device can broaden a signal, and then ameasuring result of a short pulse signal is obtained through broaden back-stepping calculation, so high-time-resolution measurement is realized.

Description

technical field [0001] The invention relates to the field of quantitative measurement of X-ray radiation flow, in particular to an X-ray time evolution process measurement device. Background technique [0002] In inertial confinement laser fusion research, X-ray radiation flow diagnostics are currently measured using two complementary techniques. [0003] One technique is to use a soft X-ray spectrometer composed of an X-ray diode (XRD) array to measure X-ray radiation flux and radiation energy spectrum. At present, a time-resolved energy spectrum with a resolution of 100 ps can be obtained through the energy channel response. [0004] Another technique is to use a flat response detector composed of a flat response film and a gold cathode XRD. This detector is also measured based on an XRD detector, and its time resolution is consistent with that of a soft X-ray spectrometer composed of an XRD array. Although this technology and device can realize quantitative measurement ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/36
CPCG01T1/366
Inventor 侯立飞刘慎业杨家敏袁铮杨国洪杜华冰李晋陈韬杨轶濛车兴森韦敏习孙奥尚万里王峰
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS