Ion mass screening device in time-of-flight mass spectrometry

A technology of time-of-flight mass spectrometry and ion mass, which is applied in the field of ion mass screening devices, can solve the problems of high background noise, affect the detection of weak ion signals, affect the service life of MCP ion detectors, etc., so as to improve the dynamic range and reduce the background noise. Effect

Active Publication Date: 2021-07-20
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, since TOFMS does not have the mass screening capability of quadrupole mass spectrometer and ion trap mass spectrometer, all ions will be received, amplified and output by the Micro Channel Plate (MCP) ion detector, which will easily cause MCP ion The saturation of the detector not only affects the detection of weak ion signals and generates high background noise, but also affects the service life of the MCP ion detector

Method used

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  • Ion mass screening device in time-of-flight mass spectrometry
  • Ion mass screening device in time-of-flight mass spectrometry

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Embodiment 1

[0036] See figure 2 shown. One of the ion mass screening electrodes of the present invention comprises three plate-shaped electrodes and an ion mass screening device with a pulse voltage U1 amplitude of 0V. When the negatively charged ions R that need to be filtered reach the ion quality screening electrode 4, a pulse voltage U1 is applied to the first and third plate structure electrodes in the ion mass screening electrode 4, and the second plate structure electrode Apply pulse voltage U2. Among them, the amplitude of U1 is 0V; U2 is a negative pulse, and its amplitude is 2000V. Then, under the action of the ion deflection electric field between the plate structure electrodes of the ion mass screening electrode 4, the ions R with this mass-to-charge ratio deflect their flight paths and deflect along the upper and lower sides of the microchannel plate 5 respectively. When the ion M required to detect the mass-to-charge ratio arrives at the ion mass screening electrode 4, t...

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Abstract

The invention relates to a mass spectrometry instrument, in particular to an ion mass screening device in a time-of-flight mass spectrometer, which includes a mass analyzer, and the mass analyzer includes a vacuum cavity, a field-free flight area located in the vacuum cavity, and a grid electrode , a microchannel plate and a Faraday disk; an ion mass screening electrode is arranged in the area between the two metal grids of the grid electrode; all adjacent plate structure electrodes of the ion mass screening electrode are respectively applied with opposite polarity, pulse Pulse voltages U1 and U2 with the same width and synchronous timing. The ion mass screening device in the time-of-flight mass spectrometer of the present invention can selectively filter the ion mass reaching the ion detector of the microchannel plate, eliminate the interference of high-intensity ion background ions and reaction reagent ions on the microchannel plate detector, and can not only The dynamic range of the instrument is effectively increased, the detection sensitivity is improved, and the service life of the ion detector of the microchannel plate can be greatly improved.

Description

technical field [0001] The invention relates to a mass spectrometry instrument, in particular to a time-of-flight mass analyzer, in particular to an ion mass screening device in a time-of-flight mass spectrometer. Background technique [0002] Time-of-Flight Mass Spectrometer (TOFMS) is a commonly used mass spectrometry technique, which determines the The mass-to-charge ratio can be used to realize the qualitative analysis of the analyte. TOFMS has simple structure, high resolution and sensitivity, wide mass range, and has microsecond-level fast response speed and full-spectrum simultaneous measurement capability. Therefore, it is widely used in ecological environment, life and health, material science, biomedicine, process analysis, etc. field has been widely used. In the detection process of actual samples, when TOFMS uses chemical ionization (Chemical Ionization, CI) source, electron impact ionization (Electron Ionization, EI) source, inductively coupled plasma ionizati...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/40
CPCH01J49/40
Inventor 花磊陈平李庆运李海洋
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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