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Electric field measurement device based on surface enhanced Raman scattering

A surface-enhanced Raman and electric field measurement technology, applied in the field of electric field detection, can solve the problems of large size, unfavorable carrying, high misjudgment rate, inability to monitor the wearer's electric field, etc., and achieve simple structure, high accuracy, and anti-interference powerful effect

Inactive Publication Date: 2020-06-05
西安柯莱特信息科技有限公司
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Problems solved by technology

[0005] The current electric field measuring instrument often uses a large-volume spherical electrode in the electrode design, which is not conducive to carrying. There is also a device like a wrist alarm that is small but has a high rate of misjudgment and cannot monitor the wearer's various parameters. direction of the electric field

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  • Electric field measurement device based on surface enhanced Raman scattering
  • Electric field measurement device based on surface enhanced Raman scattering
  • Electric field measurement device based on surface enhanced Raman scattering

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Embodiment 1

[0024] This embodiment provides a figure 1 The shown device for electric field measurement based on surface-enhanced Raman scattering includes a main body 1 , a grating structure 2 is arranged above the main body 1 , and a micro-nano metal particle layer 6 is arranged above the grating structure 2 . Biomolecules or chemical molecules are arranged on the layer 6 of micro-nano metal particles, and the device measures the Raman signal of the biomolecules or chemical molecules. The main body 1 is made of quartz, and the grating structure 2 is made of a plurality of periodically arranged quartz strips, and the intervals between the quartz strips are grooves 3; thus, when applied in a direction perpendicular to the grooves 3 An external electric field, when the applied electric field passes through the grating structure 2, will cause the size parameters of the grating structure 2 to change, thereby changing the distance between the micro-nano metal particles in the micro-nano metal ...

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Abstract

The invention relates to an electric field measurement device based on surface enhanced Raman scattering, and the device comprises a main body, a grating structure is arranged above the main body, anda micro-nano metal particle layer is arranged above the grating structure; according to the electric field measurement device, the intensity signal of an electric field can be converted into deformation of the main body, so that the parameters of the grating structure arranged above the main body are changed, Raman scattering of incident light by a micro-nano metal structure layer arranged abovethe grating structure is changed, the Raman scattering spectrum of incident light is detected, the Raman scattering spectrum is collected and analyzed through the CCD detector, and therefore the electric field is measured, and the electric field measuring device based on surface enhanced Raman scattering has the advantages of being simple in structure, high in anti-interference capacity, high in sensitivity and high in accuracy.

Description

technical field [0001] The invention belongs to the technical field of electric field detection, and in particular relates to a device for electric field measurement based on surface-enhanced Raman scattering. Background technique [0002] The electric field is a special substance existing in the space around the charge and the changing magnetic field. This kind of substance is different from ordinary substances. Although it is not composed of molecular atoms, it is a special substance that exists objectively, and has the properties of force and energy that ordinary substances have. [0003] With the rapid development of the national grid construction, the transmission lines are getting closer and closer to the areas where residents are active, and the electromagnetic environment problems caused by power frequency electric fields and DC synthetic electric fields have attracted more and more attention. Power frequency electric field is the main electromagnetic environment pa...

Claims

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Application Information

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IPC IPC(8): G01R29/12G01N21/65
CPCG01N21/658G01R29/12
Inventor 不公告发明人
Owner 西安柯莱特信息科技有限公司
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