Testing device for reactive power compensation device and testing method thereof

Abstract

The invention relates to a testing device for a reactive power compensation device and a testing method thereof. The device comprises a box body. An inverter board, a logic board, an SVG control board, a control board and an adapter board are arranged on the top surface of the box body. A support is arranged above the inverter board, an air column is arranged on the support and connected with a plurality of test probes, the heads of the test probes face the inverter board, and when an air valve of the air column is opened, the test probes make contact with test points on the inverter board. Adischarge resistor is embedded in the box body and is electrically connected with an inverter plate capacitor. A plurality of probes for testing the logic board are arranged below the logic board. Thecontrol panel is provided with a first signal input end, a second signal input end, a third signal input end, a switching value output end, an upper computer communication interface, an SVG communication interface, a switching value input end and an auxiliary power supply interface. The SVG single board and the overall test can be flexibly selected, the production requirement is better met, and the product reliability and the finished product rate are improved.

Description

technical field [0001] The invention relates to the technical field of SVG equipment testing, in particular to a testing device and a testing method for a reactive power compensation device, and in particular to testing of SVG single boards and the whole. Background technique [0002] SVG (reactive power compensation device, hereinafter referred to as SVG) product line production stage requires a series of tests, such as pulse test of igbt power board, relay and hall test of logic board, capacitance anti-reverse test of capacitor board, control board Sampling test, etc.; there are many and complicated testing procedures. During the test, multi-channel oscilloscopes, DC sources, high-power AC sources and other instruments are required, and the test costs are relatively high. [0003] During assembly line production, a series of tests are generally performed by production workers. The complex testing process and instruments extremely test the education and ability of the prod...

AI Technical Summary

Problems solved by technology

[0003] During assembly line production, a series of tests are generally performed by production workers. The complex testing process and instruments extremely test the education and ability of the producer, and the labor cost is high; and most of the SVG tests are single-board tests, which are rarely carried out. In the overall test, there are many loopholes in the test, which lead to more problems in the test of the whole machine, resulting in slow production and delivery, low efficiency, and low yield

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