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A kind of integrated circuit testing equipment

A technology for integrated circuits and test equipment, applied in the field of integrated circuit test equipment, can solve the problems of decreased test accuracy, test result error, test performance decrease, etc., so as to reduce placement disorder, reduce test error, and improve test accuracy Effect

Active Publication Date: 2022-03-25
北京京瀚禹电子工程技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, whether it is a portable integrated circuit test equipment or a desktop integrated circuit test equipment, there are often errors in the test results, especially after long-term multiple use, the test performance will decline, but it is difficult to detect, making the test accuracy In the existing technology, there is a lack of integrated circuit testing equipment that integrates portable testing technology and desktop testing technology and effectively improves testing accuracy.

Method used

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  • A kind of integrated circuit testing equipment
  • A kind of integrated circuit testing equipment
  • A kind of integrated circuit testing equipment

Examples

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Embodiment

[0044] see figure 1 and figure 2 , an integrated circuit test equipment, including a test host 1, the test host 1 is connected to a computer through a PCI bus, the test host 1 is connected to the integrated circuit through a relay matrix, the test host 1 is provided with a plurality of test extensions, and the test host 1 There are a plurality of evenly distributed placement slots 2 on the surface. The test extension is placed inside the placement slot 2. The test extension includes an extension body 3. The extension body 3 is fixedly connected with a circuit connector 4 and a host connector 5. The extension body 3 passes through The host connector 5 is electrically connected to the test host 1, and the extension body 3 is connected to the integrated circuit through the circuit connector 4. Please refer to Figure 5 , the test host 1 includes a circuit data transmission sharing system, a test data analysis system and an extension calibration system. The circuit data transmis...

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Abstract

The invention discloses an integrated circuit testing device, which belongs to the technical field of integrated circuit testing. An integrated circuit testing device includes a testing host, which is connected to a computer through a PCI bus, connected to an integrated circuit through a relay matrix, and the testing host There are multiple test extensions on the machine. The present invention provides a high-precision integrated circuit test equipment that integrates portable testing and desktop testing technologies. The present invention uses test extensions as the main test equipment, and can carry out portable testing at any time. , the test host is used as a connection auxiliary carrier for multiple test extensions, which enables multiple test extensions to simultaneously test the same integrated circuit, and concentrates on analyzing multiple test results to reduce test errors. Collect and calibrate the signal data, analyze the test performance of the test extension, detect and improve the test accuracy of the test extension.

Description

technical field [0001] The present invention relates to the technical field of integrated circuit testing, and more particularly, to an integrated circuit testing device. Background technique [0002] An integrated circuit is a miniature electronic device or component. Using a certain process, components and wirings such as transistors, resistors, capacitors and inductors required in a circuit are interconnected, fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a package. , become a miniature structure with the required circuit functions; in which all components have been formed into a whole in structure, making electronic components a big step towards miniaturization, low power consumption, intelligence and high reliability. It is represented by the letters "IC" in the circuit. [0003] Integrated circuit testing is the process of testing integrated circuits or modules to determine or evaluate the function and perf...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2886
Inventor 不公告发明人
Owner 北京京瀚禹电子工程技术有限公司