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Method and device for comprehensively and rapidly testing Trim function of NVME SSD

A functional and fast technology, applied in static memory, instruments, etc., can solve the problems of insufficient comprehensiveness and long Trim function test time, and achieve the effect of improving efficiency, improving efficiency and accuracy, and ensuring comprehensiveness

Active Publication Date: 2020-07-28
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problems existing in the prior art, the present invention innovatively proposes a method and device for comprehensively and quickly testing the NVME SSDTrim function, which effectively solves the problem that the Trim function test takes a long time and is not comprehensive enough due to the irregular trigger mechanism of the Trim function. improved testing efficiency

Method used

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  • Method and device for comprehensively and rapidly testing Trim function of NVME SSD
  • Method and device for comprehensively and rapidly testing Trim function of NVME SSD
  • Method and device for comprehensively and rapidly testing Trim function of NVME SSD

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Embodiment 1

[0045] Such as figure 1 As shown, the present invention provides a kind of method of comprehensive quick test NVME SSD Trim function, comprising:

[0046] S11, obtaining the quantity of several lba areas in the NVME SSD;

[0047] S12, read the number of block segments in the initial lba area, execute the Trim command to the initial lba area, and verify the Trim function;

[0048] S13, read the quantity of the block section in the middle lba area, judge whether the number of block sections in the middle lba area is 1, if the judgment result is yes, execute step S14; if the judgment result is no, then execute step S15;

[0049] S14. Execute the Trim command on the middle IBA area to verify the Trim function;

[0050] S15, first execute the Trim command one by one to the middle IBA area, verify the Trim function; secondly execute the Trim command simultaneously to the described middle IBA area, verify the Trim function;

[0051] S16, read the number of block segments in the en...

Embodiment 2

[0070] Such as Figure 7 As shown, a comprehensive and rapid test device for NVME SSD Trim function, including:

[0071] Acquisition module 101, obtains the quantity of some lba areas in the NVME SSD;

[0072] The first read verification module 102 reads the quantity of the block segment in the initial lba area, executes the Trim command to the initial lba area, and verifies the Trim function;

[0073] The second read verification module 103, reads the quantity of the block section in the middle lba area, if the number of block sections in the middle lba area is 1, execute the Trim command to the described middle lba area, verify the Trim function; if the number of block sections in the middle lba area Not 1, at first carry out Trim order one by one to described middle IBA area, verify Trim function; Secondly carry out Trim order simultaneously to described middle IBA area, verify Trim function;

[0074] The third read verification module 104 reads the number of block segmen...

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Abstract

The invention provides a method for comprehensively and rapidly testing the Trim function of an NVME SSD. The method comprises the steps that the number of a plurality of lba areas in the NVME SSD isobtained; trim function verification is carried out on different block segment numbers of a starting lba area, a middle lba area and an ending lba area in the SSD, Trim commands are executed on the middle lba area one by one, and a Trim function is verified; secondly, a Trim command is executed on the middle lba area at the same time, and Trim function is verified. The invention further provides adevice for comprehensively and quickly testing the Trim function of the NVME SSD, the problems that the Trim function test time is long and the Trim function test is not comprehensive enough due to an irregular triggering mechanism of the Trim function are effectively solved, the test efficiency is effectively improved, and the verification accuracy and reliability are ensured.

Description

technical field [0001] The invention relates to the field of NVME SSD test verification, in particular to a method and device for comprehensively and rapidly testing NVME SSDTrim functions. Background technique [0002] With the development of Internet, cloud computing, Internet of Things and other technologies, NVME (Non-Volatile Memoryexpress, NVM Express standard storage system) SSD (Solid State Drives, solid state drive) is widely used as a new generation of storage. [0003] In the process of developing and testing solid-state drives, the performance of solid-state drives is widely concerned, and whether the Trim function (a Data Set Management command) meets the requirements will directly affect the performance of solid-state drives, so the test of the Trim function is particularly important. important. [0004] In actual operation, the Trim function marks the invalid data on blocks in different LBA areas of the SSD, and executes corresponding trim commands for each L...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/06G11C29/10G11C29/54
CPCG11C29/06G11C29/10G11C29/54
Inventor 冯超
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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