Circuit structure for measuring single-particle transient pulse width

Abstract

The invention discloses a circuit structure for measuring single-particle transient pulse width. The circuit structure comprises a control circuit, an attenuation unit, a delay unit, a drive buffer and a counting circuit. The control circuit is used for controlling the pulse to be transmitted to a cyclic structure formed by the circuit, the attenuation unit, the delay unit and the drive buffer after the single-particle transient pulse arrives. The attenuation unit is used for reducing the pulse width, and the delay unit is used for enabling the delay width of the cyclic structure to be largerthan the pulse width. The counting circuit uses the register and the adder to count the number of cycles of the pulse in the cycle structure, the clock signal of the register is provided by the pulsewithout additional provision, and the measurement result of the single event transient pulse width is the product of the amount of each cycle attenuation and the number of cycles. The realized circuitstructure is large in measurable range and high in measurement precision.

Description

Technical field [0001] The present invention relates to a circuit structure for measuring the width of a single-event transient pulse, in particular to a structure in which a certain amount of pulse attenuation width is realized by a cyclic structure and the number of pulse cycles is counted by a circuit to measure single-event transients in a space radiation environment. State pulse width. Background technique [0002] Single event transient effect (SET) means that when high-energy particles enter the sensitive area of ​​the device, transient current pulses will be generated in the device, which will lead to circuit function errors. The integrated circuits used in aerospace will affect the normal operation of the integrated circuits because they work in the complex space irradiation environment. [0003] SET propagates down the data path in the circuit, and may be latched by the timing unit in the circuit, resulting in circuit system output failure and soft errors. In addition, t...

AI Technical Summary

Problems solved by technology

If the single event pulse width is wide, the number of series required will be large, and the hardware resources and power consumption will be very large.

[0005] In addition, there is a circuit structure for measuring the transient pulse width of a single event that uses the counting principle in the structure, but its measurement accuracy is limited by the delay time of the minimum three-stage inverter and the time required for each counting process of the counter used in it. limit

In addition, a relatively complex microcontroller circuit is used, which increases the difficulty of design, and at the same time consumes a lot of hardware resources and consumes a lot of power.

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