An X-ray detector structure and its working method

Abstract

An X-ray detector structure and working method thereof, comprising a detector chip, a front scintillator, a back scintillator, a substrate, and a fixed structure; the detector chip includes a normal incidence surface and a rear incidence surface; the normal incidence surface The photosensitive area is attached to the front scintillator, and the photosensitive area of ​​the back incidence surface is attached to the back scintillator; the non-photosensitive area of ​​the detector chip is attached to the substrate, and one end or both ends of the detector chip are provided with signal The transmission area and the signal transmission area is conducted to the substrate through bonding wires. The X-ray detector structure and its working method described in the present invention have reasonable structural design and simple working method, adopt double-sided incidence mode, increase the thickness of the overall scintillator of the X-ray detector, and do not reduce the light output of the scintillator at the same time, Moreover, the area of ​​the detector chip is not increased, the signal size is guaranteed, the imaging quality is improved, and the application prospect is broad.

Description

technical field [0001] The invention relates to the technical field of X-ray detectors, in particular to a structure of an X-ray detector and a working method thereof. Background technique [0002] An X-ray detector is a device that converts X-ray energy into electrical signals that can be recorded. It is usually composed of a scintillator, a detector chip, and a substrate, such as figure 1 As shown, the working principle is that X photons are incident into the scintillator, converted into visible light output, and entered into the detector chip. The photoelectric conversion is then performed by the detector chip to form an electrical signal, which is transmitted to the subsequent signal processing chip through the wires on the chip and the substrate to form the final image. [0003] According to the direction of incident light, the detector chip is divided into two types: forward-entry type and back-entry type, such as figure 2 As shown in the figure, in the positive det...

AI Technical Summary

Problems solved by technology

[0005] However, a thicker scintillator will bring some problems: First, as the thickness of the scintillator increases, the visible light absorbed by X-rays needs a longer path to be transmitted to the surface of the detector chip, while the visible light transmission In the process, it may be absorbed

[0007] The Chinese patent application No. CN201910706450.5 discloses an X-ray detector and its preparation method. The first photosensitive layer and the second photosensitive layer arranged on both sides of the scintillator layer are independently coupled and sampled, and the low-radiation Under the single exposure condition of the dose, the spatial resolution and the fluorescence absorption rate are improved at the same time, the radiation dose and the signal-to-noise ratio are optimized, and the problems such as the decrease of the light output caused by the increase of the thickness of the scintillator and the damage caused by the large mass are not solved.

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