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Microscopic image focus drift distance measurement method and system, computer equipment

A technology of microscopic image and drift distance, applied in measurement devices, neural learning methods, instruments, etc., can solve problems such as large errors, and achieve the effects of high speed, strong robustness and high precision

Active Publication Date: 2021-07-20
湖南国科智瞳科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The invention provides a method, system and computer equipment for measuring the focus drift distance of a microscopic image, which are used to overcome defects such as relatively large errors in the prior art

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  • Microscopic image focus drift distance measurement method and system, computer equipment
  • Microscopic image focus drift distance measurement method and system, computer equipment
  • Microscopic image focus drift distance measurement method and system, computer equipment

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0029] In addition, the technical solutions of the various embodiments of the present invention can be combined with each other, but it must be based on the realization of those skilled in the art. When the combination of technical solutions is contradictory or cannot be realized, it should be considered as a combination of technical solutions. Does not exist, nor is it within the scope of protection required by the present invention.

[0030] The inv...

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Abstract

The invention discloses a method for measuring the focus drift distance of a microscopic image, which includes acquiring a microscopic image sequence; calculating the radial average logarithmic power spectrum value of each incoherent focus stack image, and calculating the The power spectrum value is used to obtain the focus position of the microscope objective lens; according to the focus position, each of the coherent focus stack images is marked; the marked coherent focus stack images are divided into a training set and a verification set; using the training set Train the pre-built convolutional neural network model, use the verification set to verify the trained convolutional neural network model, and obtain the trained convolutional neural network model; use the trained convolutional neural network model to measure the The measured microscopic image focus drift distance. The method provided by the invention can realize the measurement of the focus drift distance only through a single image, and has high speed, high precision and strong robustness of the convolutional neural network model.

Description

technical field [0001] The invention relates to the technical field of microscopic imaging, in particular to a method, system and computer equipment for measuring the focus drift distance of a microscopic image. Background technique [0002] Maintaining the focus of microscopic images over long periods of time is a critical task for various high-throughput applications of digital microscopy. Many biological experiments involve the use of microscopes to perform microscopic imaging of samples over long periods of time or on large spatial scales, which makes it difficult to keep the samples in focus. [0003] For microscopic imaging applications on large spatial scales, when scanning and stitching multiple microscope fields of view to form high-content, high-resolution microscopic images, due to changes in sample shape or unevenness of the stage surface, it is necessary to The field of view is refocused to obtain a clear full-field image. [0004] For long-term microscopic im...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G06N3/04G06N3/08
CPCG01B11/02G06N3/08G06N3/045
Inventor 谷秀娟向北海许会
Owner 湖南国科智瞳科技有限公司
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